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Article
Measuring the Interatomic Distance in a Silicon Crystal Lattice Using an Optical Scanning Interferometer
We study the influence of the characteristics of the optical system of an interferometer on the distribution of spectral power density of partially coherent light passing through the system. The results of mea...
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Article
Improving the Reliability of Interference Measurements by using Several Wavelengths
Methods are proposed to improve the reliability of interference measurements of surface nanotopography with sharp height gradients that lead to ambiguity in determining the phase of interference signals. The e...
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Article
Adaptive thresholding of differential interferograms
A method is proposed for selecting an adaptive threshold for the detection of an interference signal in an optical profilometer based on estimation of optical quantum noise in interferograms of each measuremen...
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Article
Interference microscope-profilometer
The structure and functional capabilities of a digital optical microscope-profilometer capable of operating in two modes, those of micro- and nanomeasurements, are presented. The instrument operation principle...
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Article
An optical method for detecting mechanical defects on high-grade-finish surfaces
A method for detecting surface defects is discussed. The method is based on analyzing the light scattering function with reference to the problem concerned with automatic control of a fuel cladding surface.
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Article
Enhancing the selectivity of the X-ray luminescence separation of diamonds by digital processing of signals
A brief description is presented for a new digital-analog unit designed for recording and processing of signals from photodetectors of an X-ray luminescent separating machine, with a software-supported choice ...
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Article
White-light interferometer with partial correlogram scanning
A method for measurement of a surface microprofile with a nanometer resolution is described. The method is based on partial scanning of correlograms in a Linnik white-light interferometer. Experimental results...
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Article
Devices for Continuous Recording of the Parameters of Deformation—Wave Processes in Rock Mass. Part II: Design of the Optoelectronic Micrometer Sensor
An optoelectronic micrometer display sensor for determining deformations in samples of rocks and models of block geomedia is presented. The sensor is equipped with a microprocessor data collection system for t...
