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  1. Article

    Open Access

    Sorting Gold and Sand (Silica) Using Atomic Force Microscope-Based Dielectrophoresis

  2. The dielectrophoresis-based platform combined with micropipette-based atomic force microscope is demonstrated for material- and position-selective depositi...

    3. Chungman Kim, Sunghoon Hong, Dongha Shin, Sangmin An, **ngcai Zhang… in Nano-Micro Letters (2021)

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    Article

    Measuring Dielectrophoresis Force for Metallic and Non-metallic Particle Manipulations via a Quartz Tuning Fork Atomic Force Microscope

    Dielectrophoresis (DEP) force is a widely studied topic because it has high utility in various research areas. Understanding DEP force is significant from the point of view of its efficient usage. Here, we con...

    Sunghoon Hong, Chungman Kim, Hansol Song… in Journal of the Korean Physical Society (2019)

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    Article

    Buckling tip-based nanoscratching with in situ direct measurement of shear dynamics

    We have demonstrated a nanoscratching technique using in situ direct measurement of the elastic and viscous responses of shear dynamics for a buckled quartz nanorod tip. The buckled tip resolves the issue of d...

    Sangmin An, Chungman Kim, Wonho Jhe in Applied Nanoscience (2019)