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  1. No Access

    Article

    Bayesian inference for multi-label classification for root cause analysis and probe card maintenance decision support and an empirical study

    Probe cards have been employed as intermediary tools between the wafers and automatic test equipment to prevent defect dies from entering the packaging stage to reduce the consumer risk and extra losses. To en...

    Chen-Fu Chien, Jia-Yu Peng in Journal of Intelligent Manufacturing (2024)

  2. No Access

    Book and Conference Proceedings

    Proceedings of Industrial Engineering and Management

    International Conference on Smart Manufacturing, Industrial and Logistics Engineering and Asian Conference of Management Science and Applications

    Chen-Fu Chien, Runliang Dou, Li Luo in Lecture Notes in Mechanical Engineering (2024)

  3. No Access

    Article

    Integrated circuit probe card troubleshooting based on rough set theory for advanced quality control and an empirical study

    Wafer probe test plays a crucial role to distinguish the good dies from the remaining defected dies on the wafers via the probe card as the testing signal interface between the tester and the integrated circui...

    Chen-Fu Chien, Hsin-Jung Wu in Journal of Intelligent Manufacturing (2024)

  4. No Access

    Article

    Pitfalls and protocols of data science in manufacturing practice

    Driven by ongoing migration for Industry 4.0, the increasing adoption of artificial intelligence, big data analytics, cloud computing, Internet of Things, and robotics have empowered smart manufacturing and di...

    Chia-Yen Lee, Chen-Fu Chien in Journal of Intelligent Manufacturing (2022)

  5. No Access

    Article

    Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study

    Probe card that serves as the carrier of die and the transmitter of information is an indispensable test interface for integrated circuit testing. The probe card extracts the electrical signal of chip and send...

    Wenhan Fu, Chen-Fu Chien, Lizhen Tang in Journal of Intelligent Manufacturing (2022)

  6. Article

    Taiwan Drought was a Microcosm of Climate Change Adaptation Challenges in Complex Island Economies

    Kathleen B. Aviso, Chen-Fu Chien in Process Integration and Optimization for S… (2021)

  7. No Access

    Article

    Tool allocation to smooth work-in-process for cycle time reduction and an empirical study

    As semiconductor devices are increasingly employed in consumer electronics and industrial applications, cycle time reduction is critical for semiconductor companies to maintain competitive advantages. Semicond...

    Chen-Fu Chien, Chung-Jen Kuo, Chih-Min Yu in Annals of Operations Research (2020)

  8. No Access

    Chapter

    Management Suggestions for Process Control of Semiconductor Manufacturing: An Operations Research and Data Science Perspective

    With advances in information and telecommunication technologies and data-enabled decision-making, smart manufacturing can be an essential component of sustainable development. In the era of the smart world, se...

    Marzieh Khakifirooz, Mahdi Fathi in Computational Intelligence and Optimizatio… (2019)

  9. No Access

    Article

    A bi-objective genetic algorithm for intelligent rehabilitation scheduling considering therapy precedence constraints

    The rehabilitation inpatients in hospitals often complain about the service quality due to the long waiting time between the therapeutic processes. To enhance service quality, this study aims to propose an int...

    Lizhong Zhao, Chen-Fu Chien, Mitsuo Gen in Journal of Intelligent Manufacturing (2018)

  10. Chapter and Conference Paper

    Constructing a Metrology Sampling Framework for In-line Inspection in Semiconductor Fabrication

    Due to the shrinking IC device geometries and increasing interconnect layers, process complexity has been rapidly increasing and leads to higher manufacturing costs and longer cycle time. Thus, in-line metrolo...

    Chen-Fu Chien, Yun-Siang Lin, Yu-Shin Tan in Advances in Production Management Systems.… (2018)

  11. Chapter and Conference Paper

    A Hybrid Forecasting Framework with Neural Network and Time-Series Method for Intermittent Demand in Semiconductor Supply Chain

    As the primary prerequisite of capacity planning, inventory control and order management, demand forecast is a critical issue in semiconductor supply chain. A great quantity of stock kee** units (SKUs) with ...

    Wenhan Fu, Chen-Fu Chien, Zih-Hao Lin in Advances in Production Management Systems.… (2018)

  12. Article

    Industry Applications of Computational Intelligence

    Runliang Dou, Chen-Fu Chien, Imed Kacem in International Journal of Computational Int… (2018)

  13. No Access

    Article

    Embedding ant system in genetic algorithm for re-entrant hybrid flow shop scheduling problems with time window constraints

    This paper focuses on minimizing the makespan for a reentrant hybrid flow shop scheduling problem with time window constraints (RHFSTW), which is often found in manufacturing systems producing the slider part ...

    Chettha Chamnanlor, Kanchana Sethanan, Mitsuo Gen in Journal of Intelligent Manufacturing (2017)

  14. No Access

    Article

    Multistage production distribution under uncertain demands with integrated discrete particle swarm optimization and extended priority-based hybrid genetic algorithm

    Production distribution systems are increasingly crucial because of shortened product life cycles, increasing competition, and uncertainty introduced by globalization. Production distribution involves a multis...

    Thitipong Jamrus, Chen-Fu Chien, Mitsuo Gen in Fuzzy Optimization and Decision Making (2015)

  15. No Access

    Chapter

    Flexible Multistage Forward/Reverse Logistics Network Under Uncertain Demands with Hybrid Genetic Algorithm

    Logistics network is increasingly crucial because of shortened product life cycles, increasing competition, and uncertainty introduced by globalization. The logistics network distribution involves a multistage...

    Thitipong Jamrus, Chen-Fu Chien, Mitsuo Gen in Toward Sustainable Operations of Supply Ch… (2015)

  16. Article

    Manufacturing intelligence and innovation for digital manufacturing and operational excellence

    Chen-Fu Chien, Mitsuo Gen, Yongjiang Shi in Journal of Intelligent Manufacturing (2014)

  17. No Access

    Article

    Determining the operator-machine assignment for machine interference problem and an empirical study in semiconductor test facility

    Semiconductor is a capital-intensive industry in which equipment costs account for more than seventy percentage of the capital investment in semiconductor test facilities. In an industrial investigation, the m...

    Chen-Fu Chien, Jia-Nian Zheng, Yi-Jay Lin in Journal of Intelligent Manufacturing (2014)

  18. No Access

    Article

    An empirical study of design-of-experiment data mining for yield-loss diagnosis for semiconductor manufacturing

    To maintain competitive advantages, semiconductor industry has strived for continuous technology migrations and quick response to yield excursion. As wafer fabrication has been increasingly complicated in nano...

    Chen-Fu Chien, Kuo-Hao Chang, Wen-Chih Wang in Journal of Intelligent Manufacturing (2014)

  19. No Access

    Article

    The cooperative estimation of distribution algorithm: a novel approach for semiconductor final test scheduling problems

    A large number of studies have been conducted in the area of semiconductor final test scheduling (SFTS) problems. As a specific example of the simultaneous multiple resources scheduling problem, intelligent ma...

    **n-Chang Hao, Jei-Zheng Wu, Chen-Fu Chien in Journal of Intelligent Manufacturing (2014)

  20. No Access

    Article

    Hierarchical indices to detect equipment condition changes with high dimensional data for semiconductor manufacturing

    During semiconductor manufacturing process, massive and various types of interrelated equipment data are automatically collected for fault detection and classification. Indeed, unusual wafer measurements may r...

    Hui-Chun Yu, Kuo-Yi Lin, Chen-Fu Chien in Journal of Intelligent Manufacturing (2014)

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