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  1. Article

    Open Access

    Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope

    In this work, we introduce position-resolved surface characterization and nanofabrication using an optical microscope (OM) combined with a nanopipette-based quartz tuning fork atomic force microscope (nanopipe...

    Sangmin An, Baekman Sung, Haneol Noh, Corey Stambaugh, Soyoung Kwon… in Nano-Micro Letters (2014)

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