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    Nanoscale Investigation of Grain Growth in RF-Sputtered Indium Tin Oxide Thin Films by Scanning Probe Microscopy

    This work studied the electronic characteristics of the grains and grain boundaries of indium tin oxide (ITO) thin films using electrostatic and Kelvin probe force microscopy. Two types of ITO films were compa...

    B. S. Lamsal, M. Dubey, V. Swaminathan, Y. Huh… in Journal of Electronic Materials (2014)