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Article
Ellipsometric study of a palladium catalyst during the oxidation of carbon monoxide and methane
Spectroscopic ellipsometry is used to monitor the surface of a thick Pd‐film catalyst during the oxidation of either carbon monoxide or methane. Dense PdO layers form under sufficiently lean conditions (excess...
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Article
In situ ellipsometric study of a palladium catalyst during the oxidation of methane
Ellipsometry is used to follow the growth of a PdO layer on the surface of a thick Pd-film catalyst during methane oxidation at ∼ 500°C. The oxide layer that develops under rich conditions (excess CH4) is quite p...