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    In situ ellipsometric study of a palladium catalyst during the oxidation of methane

    Ellipsometry is used to follow the growth of a PdO layer on the surface of a thick Pd-film catalyst during methane oxidation at ∼ 500°C. The oxide layer that develops under rich conditions (excess CH4) is quite p...

    D. König, W. H. Weber, B. D. Poindexter, J. R. McBride, G. W. Graham… in Catalysis Letters (1994)