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    Article

    Ellipsometric study of a palladium catalyst during the oxidation of carbon monoxide and methane

    Spectroscopic ellipsometry is used to monitor the surface of a thick Pd‐film catalyst during the oxidation of either carbon monoxide or methane. Dense PdO layers form under sufficiently lean conditions (excess...

    G.W. Graham, D. König, B.D. Poindexter, J.T. Remillard, W.H. Weber in Topics in Catalysis (1999)

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    Article

    In situ ellipsometric study of a palladium catalyst during the oxidation of methane

    Ellipsometry is used to follow the growth of a PdO layer on the surface of a thick Pd-film catalyst during methane oxidation at ∼ 500°C. The oxide layer that develops under rich conditions (excess CH4) is quite p...

    D. König, W. H. Weber, B. D. Poindexter, J. R. McBride, G. W. Graham… in Catalysis Letters (1994)