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Article
Open AccessProfilometry of thin films on rough substrates by Raman spectroscopy
Thin, light-absorbing films attenuate the Raman signal of underlying substrates. In this article, we exploit this phenomenon to develop a contactless thickness profiling method for thin films deposited on roug...
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Chapter and Conference Paper
Displacement Interferometry within a Passive Fabry-Perot Cavity
The idea of stabilized wavelength within a certain defined measuring range leads quite directly to a cavity – based design. A passive Fabry-Perot cavity has been traditionally used as an etalon for laser frequ...
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Article
Microscopic Characterizations of Nanostructured Silicon Thin Films for Solar Cells
Microscopic characterization of mixed phase silicon thin films by conductive atomic force microscopy (C-AFM) was used to study the structure composed of conical microcrystalline grains dispersed in amorphous m...
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Article
Open AccessSynthesis, structure, and opto-electronic properties of organic-based nanoscale heterojunctions
Enormous research effort has been put into optimizing organic-based opto-electronic systems for efficient generation of free charge carriers. This optimization is mainly due to typically high dissociation ener...
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Article
Microscopic Aspects Of Charge Transport In Hydrogenated Microcrystalline Silicon
Charge transport in hydrogenated microcrystalline silicon (µc-Si:H) is determined by structure on several size scales: i) local atomic arrangement (<1 nm), ii) crystalline grains and their boundaries (1–10 nm)...
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Article
Nanostructural composites of phthalocyanine and metals
Thin composite films of metal nanoparticles incorporated into a phthalocyanine matrix were prepared by simultaneous vacuum deposition of copper and phthalocyanine from two evaporation sources. Absorption spect...
