Skip to main content

and
  1. Article

    Physical Properties of Bulk GaN Crystals Grown by HVPE

    Free standing GaN platelets were fabricated by hydride vapor phase epitaxy (HVPE). The platelets having a current maximum size of 7×6×0.1 mm3 were obtained by HVPE growth of ~100 µm thick GaN layers on SiC substr...

    Yu.V. Melnik, K.V. Vassilevski in MRS Internet Journal of Nitride Semiconduc… (2014)

  2. No Access

    Article

    GaN 20-mm Diameter Ingots Grown from Melt-Solution by Seeded Technique

    In this paper, we describe the seeded growth of ∼20 mm diameter 15 mm long GaN ingots from the melt-solution. This is the first successful attempt to conduct growth of GaN boule-crystals. GaN ingots were grown...

    V. A. Sukhoveyev, V. A. Ivantsov, I. P. Nikitina in MRS Online Proceedings Library (2012)

  3. Article

    GaN 20-mm Diameter Ingots Grown from Melt-Solution by Seeded Technique

    In this paper, we describe the seeded growth of ∼20 mm diameter 15 mm long GaN ingots from the melt-solution. This is the first successful attempt to conduct growth of GaN boule-crystals. GaN ingots were grown...

    V. A. Sukhoveyev, V. A. Ivantsov in MRS Internet Journal of Nitride Semiconduc… (2000)

  4. No Access

    Article

    AIN/GaN and AIGaN/GaN Heterostructures Grown by HVPE on SiC Substrates

    GaN, AIN and AIGaN layers were grown by hydride vapor phase epitaxy. 6H-SiC wafers were used as substrates. Properties of AIN/GaN and AIGaN/GaN structures were investigated. AIGaN growth rate was about 1 μm/mi...

    Yu.V. Melnik, A.E. Nikolaev, S.I. Stepanov, A.S. Zubrilov in MRS Online Proceedings Library (1997)

  5. Article

    GaN Layers Grown by HVPE on P-type 6H-SiC Substrates

    Gallium nitride films were successfully grown by HVPE technique on p-type 6H-SiC substrate. The layers exhibit high crystal quality as was determined by X-ray diffraction. Photoluminescence (PL) of these films...

    A.E. Nikolaev, Yu.V. Melnik, M.N. Blashenkov in MRS Internet Journal of Nitride Semiconduc… (1996)

  6. Article

    Fabrication of GaN mesa structures

    We report on nickel based technology for the fabrication of GaN mesa structures. Ti/Ni ohmic contacts for n-doped GaN with contact resistivity Rc ~2×10-5 Ω×cm2 and Ni ohmic contacts for p-doped GaN with Rc ~ 4×10

    K.V. Vassilevski, M.G. Rastegaeva in MRS Internet Journal of Nitride Semiconduc… (1996)