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Modification of electrical and optical properties of CuO thin films by Ni do**

  • Original Paper: Sol-gel and hybrid materials for optical, photonic and optoelectronic applications
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Abstract

Undoped and Ni-doped CuO thin films were deposited onto glass substrates using a spin-coating technique at different do** concentrations (undoped, 2, 4, 6, and 10 %). X-ray diffraction patterns for undoped and Ni-doped CuO thin films indicated that the films were polycrystalline, with preferential growth in the (002), (111), and (−311) directions. Atomic force microscopy images revealed that the surface morphologies of the films were not uniform. Scanning electron microscopy images confirmed the presence of agglomerated particles on the surfaces; the coverage increased with the do** level. A Hall effect system with a van der Pauw configuration was used to investigate the electrical properties of the CuO films. The free charge carrier concentration decreased and hole mobility increased with increasing Ni concentration, with the exception of the 10 % Ni-doped CuO sample. Ultraviolet–visible spectroscopy measurements of the film samples indicated an average transmittance of 30–40 % in the visible range. The optical band gap decreased slightly for low-level do** and increased from 2.03 to 2.22 eV for 10 % Ni incorporation. The electrical and optical properties of the CuO films were modified by Ni do**, i.e. the band gap decreased and the mobility increased almost linearly, with the exception of the 10 % Ni-doped sample.

Graphical Abstract

SEM images of a undoped b 2 % c 4 % d 6 %, and e 10 % Ni-doped CuO thin films.

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Authors and Affiliations

  1. Department of Physics, Faculty of Science, Dicle University, Dicle, Turkey

    Silan Baturay, Derya Kaya, Murat Tokus & Tahsin Kilicoglu

  2. Department of Physics, Faculty of Science, Batman University, Batman, Turkey

    Ahmet Tombak

  3. Science and Technology Application and Research Center, Dicle University, Diyarbakir, Turkey

    Yusuf Selim Ocak & Murat Aydemir

  4. Faculty of Education, Department of Science, Dicle University, Diyarbakir, Turkey

    Yusuf Selim Ocak

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  1. Silan Baturay
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  2. Ahmet Tombak
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  4. Yusuf Selim Ocak
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Correspondence to Yusuf Selim Ocak.

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Baturay, S., Tombak, A., Kaya, D. et al. Modification of electrical and optical properties of CuO thin films by Ni do**. J Sol-Gel Sci Technol 78, 422–429 (2016). https://doi.org/10.1007/s10971-015-3953-4

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  • DOI: https://doi.org/10.1007/s10971-015-3953-4

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