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Dielectric constants and double-layer formation in a perovskite thin film revealed by electrochemical impedance spectroscopy

  • Organic and Perovskite Materials and Devices Research Letter
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Abstract

Hybrid perovskites have attracted great interest in solar energy conversion and optoelectronic applications. The interconnected ionic and electronic effects complicate assessing the underlying electrical processes while contributing greatly to the efficiency and stability of devices. Fortunately, these coupled processes manifest on distinct timescales that enable frequency-specific electrochemical analysis. However, hybrid perovskites dissolve in most of the common aqueous and organic solvents utilized for electrochemistry. Here, we utilize a hydrofluoroether (HFE) solvent toolkit to perform nondestructive electrochemical impedance spectroscopy of methylammonium lead iodide (MAPbI3) perovskite thin films. This enables the extraction of dielectric constants and double-layer formation in these perovskite films.

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Data availability

The data that support the findings of this study are available from the corresponding author upon reasonable request.

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Acknowledgments

This article is dedicated to Alex Zakhidov, who co-pioneered the application of orthogonal liquids to the processing of organic materials in electronic devices, particularly for organic photovoltaics, transistors, and LEDs.[29,30] He applied HFE solvents in electrochemical do** and study of perovskites devices.[17,19] He inspired this work, and it is with a great sense of loss that we carry this research forward in his absence. We would also like to thank Muhammad Khalid and Akbar Ali for their help with supporting measurements.

Funding

J.D.S. acknowledges the support from the National Science Foundation Electrical, Communications and Cyber Systems (ECCS 1906505). A.Z. acknowledges support from the Welch Foundation (AT-1617) and the Russian Science Foundation (19-73-30023).

Author information

Authors and Affiliations

  1. Department of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, SCI 10, Richardson, TX, 75080-3021, USA

    Sauraj Jha, Anvar A. Zakhidov & Jason D. Slinker

  2. Department of Physics, The University of Texas at Dallas, 800 West Campbell Road, SCI 10, Richardson, TX, 75080-3021, USA

    Ross Haroldson, Anvar A. Zakhidov & Jason D. Slinker

  3. Department of Chemistry, The University of Texas at Dallas, 800 West Campbell Road, SCI 10, Richardson, TX, 75080-3021, USA

    Jason D. Slinker

  4. NanoTech Institute, The University of Texas at Dallas, 800 West Campbell Road, Richardson, TX, 75080-3021, USA

    Anvar A. Zakhidov

  5. Samarkand Quantum Center, Samarkand National University, Samarkand, Republic of Uzbekistan

    Anvar A. Zakhidov

Authors
  1. Sauraj Jha
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  2. Ross Haroldson
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Contributions

SJ, RH, and JS contributed to conceptualization ; SJ and RH contributed to data curation; SJ, RH, AZ, and JS contributed to formal analysis ;AZ and JS contributed to funding acquisition; SJ, RH, AZ, and JS contributed to investigation; JS contributed to project administration; AZ and JS contributed to supervision; SJ contributed to validation; JS contributed to writing—original draft; SJ, RH, AZ, and JS contributed to writing—review and editing.

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Correspondence to Jason D. Slinker.

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Jason D. Slinker and Anvar A. Zakhidov were editors of this journal during the review and decision stage. For the MRS Communications policy on review and publication of manuscripts authored by editors, please refer to http://www.mrs.org/editor-manuscripts/.

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Jha, S., Haroldson, R., Zakhidov, A.A. et al. Dielectric constants and double-layer formation in a perovskite thin film revealed by electrochemical impedance spectroscopy. MRS Communications 14, 196–200 (2024). https://doi.org/10.1557/s43579-023-00495-3

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