Abstract
We report the microstructures and dielectric properties of Ca1-x SrxCu3Ti4O12 (C1-xSx CTO, 0≤x≤1) ceramics sintered at the various sintering temperatures ranging from 1000 to 1060˚C in air. The linear increase in lattice parameter in C1-xSx CTO (0≤x≤1) ceramics is observable for the full range of substitution. However, the second phases of SrTiO3 and CuO start to occur from the composition of x=0.8, implying that a stoichiometric SrCu3Ti4O12 (SCTO) compound may not exist. While the C0.6S0.4CTO and C0.4S0.6CTiO samples exhibit relatively lower dielectric constant (εr) of ∼40,000 below 1 kHz, the CaCu3Ti4O12 (CCTO) and SCTO show the extremely high εr values of ~120,000 and ∼180,000, respectively. Complex impedance (Z*) and modulus (M*) spectroscopy revealed that the capacitance (C) and resistivity (ρ) values of grain boundary in all samples are much higher than those of grains.
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Acknowledgements
This work was supported by the Korea Science and Engineering Foundation (KOSEF) grant funded by the Korea government (MEST) (No. 2010-0027688).
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Yun Lee, S., Yoo, DK., Lee, J. et al. Fabrication and Characterization of Colossal Dielectric Response of Polycrystalline Ca1-x SrxCu3Ti4O12 (0≤x≤1) Ceramics. MRS Online Proceedings Library 1454, 81–87 (2012). https://doi.org/10.1557/opl.2012.1071
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DOI: https://doi.org/10.1557/opl.2012.1071