Abstract
In this paper, we intend to show the role of plasma parameters on the performance of the simulated device Plasma-Assisted Vertically Aligned Dual-Metal Carbon Nanotube Field-Effect Transistor (VA-DMCNFET) for the first time. Here, vertically aligned semiconducting Carbon Nanotube (CNT) synthesized using Plasma-Enhanced Chemical Vapor Deposition (PECVD) technique is implemented as the channel. The proposed device shows significant improvement in performance over conventional Nanowire Field-Effect Transistor (NWFET). Next, the device geometry and electrical properties are related to the PECVD parameters by means of a physical model. The DC and analog performance of VA-DMCNFET at various plasma parameters corresponding to different values of CNT channel radius (for fixed CNT channel length) and different values of CNT channel length (for fixed CNT channel radius) is analyzed. It is observed that lower values of plasma parameters are essential for higher values of drain current, transconductance, output conductance, cutoff frequency, and lower values of threshold voltage and channel resistance. On the other hand, higher values of plasma parameters are essential for better ION/IOFF current ratio, early voltage, and gain of the proposed device. By altering the plasma parameters, efficiency of the device can be improved leading to better real-life applicability and performance. The results obtained from this study have been verified with the existing experimental observations for validation of chosen mechanisms.
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig1_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig2_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig3_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig4_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig5_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig6_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig7_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig8_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig9_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig10_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig11_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig12_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig13_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig14_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs00339-021-05096-2/MediaObjects/339_2021_5096_Fig15_HTML.png)
Similar content being viewed by others
Availability of data and material
The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.
References
A.K. Gupta, A. Raman, Performance analysis of electrostatic plasma-based do**less nanotube TFET. Appl. Phys. A 126, 573 (2020). https://doi.org/10.1007/s00339-020-03736-7
H.M. Fahad, M.M. Hussain, High-performance silicon nanotube tunneling fet for ultralow-power logic applications. IEEE Trans. Electron Devices 60(3), 1034 (2013). https://doi.org/10.1109/TED.2013.2243151
C. Qiu, Z. Zhang, M. **ao, Y. Yang, D. Zhong, L.-M. Peng, Scaling carbon nanotube complementary transistors to 5-nm gate lengths. Science 355(6322), 271 (2017)
I. Santolia, A. Tewari, S.C. Sharma, R. Sharma, Effect of do** on growth and field emission properties of spherical carbon nanotube tip placed over cylindrical surface. Phys. Plasmas 21(6), 063508 (2014)
A. Rochefort, D.R. Salahub, P. Avouris, Effects of finite length on the electronic structure of carbon nanotubes. J. Phys. Chem. B 103(4), 641–646 (1999)
T. Mizutani, H. Ohnaka, Y. Okigawa, S. Kishimoto, Y. Ohno, A study of preferential growth of carbon nanotubes with semiconducting behavior grown by plasma-enhanced chemical vapor deposition. J. Appl. Phys. 106(7), 073705 (2009). https://doi.org/10.1063/1.3234389
D. Phokharatkul, Y. Ohno, H. Nakano, S. Kishimoto, T. Mizutani, High-density horizontally aligned growth of carbon nanotubes with Co nanoparticles deposited by arc-discharge plasma method. Appl. Phys. Lett. 93(5), 053112 (2008)
Y. Ono, S. Kishimoto, Y. Ohno, T. Mizutani, Thin film transistors using PECVD-grown carbon nanotubes. Nanotechnology 21(20), 205202 (2010)
S.C. Sharma, A. Tewari, Effect of plasma parameters on growth and field emission of electrons from cylindrical metallic carbon nanotube surfaces. Phys. Plasmas 18(8), 083503 (2011)
A. Tewari, S.C. Sharma, Theoretical modeling of temperature dependent catalyst-assisted growth of conical carbon nanotube tip by plasma enhanced chemical vapor deposition process. Phys. Plasmas 22(2), 023505 (2015)
T. Kato, R. Hatakeyama (2010), Growth of single-walled carbon nanotubes by plasma CVD. J. Nanotechnol.
C. Suresh, N. Sharma, Phys. Plasmas 22(12), 123517 (2015)
R. Gupta, S.C. Sharma, R. Sharma, Mechanisms of plasma-assisted catalyzed growth of carbon nanofibres: a theoretical modelling. Plasma Sources Sci Technol 26(2), 024006 (2017)
Y.C. Choi, D.J. Bae, Y.H. Lee, B.S. Lee, G.-S. Park, W.B. Choi, J.M. Kim, Growth of carbon nanotubes by microwave plasma-enhanced chemical vapor deposition at low temperature. J. Vac. Sci. Technol. A: Vac., Surf., Films 18(4), 1864–1868 (2000)
L. Nougaret, H. Happy, G. Dambrine, V. Derycke, J.-P. Bourgoin et al., 80 GHz field-effect transistors produced using high purity semiconducting single-walled carbon nanotubes. Appl. Phys. Lett. 94, 243505 (2009)
S. **g Guo, A. Hasan, G.B. Javey, M. Lundstrom, Assessment of high-frequency performance potential of carbon nanotube transistors. IEEE Trans. Nanotechnol. 4(6), 715–721 (2005). https://doi.org/10.1109/TNANO.2005.858601
Y. Li, D. Mann, M. Rolandi, W. Kim, A. Ural, S. Hung, A. Javey, J. Cao, D. Wang, E. Yenilmez, Q. Wang, J.F. Gibbons, Y. Nishi, H. Dai, Preferential growth of semiconducting single-walled carbon nanotubes by a plasma enhanced CVD method. Nano Lett. 4(2), 317–321 (2004)
T. Mizutani, Y. Ohno, S. Kishimoto, Electrical properties of carbon nanotube FETs. 2008 International Conference on Advanced Semiconductor Devices and Microsystems, pp. 1–8,(2008).doi: https://doi.org/10.1109/ASDAM.2008.4743290
F. Bashir, S.A. Loan, M. Rafat, A.R.M. Alamoud, S.A. Abbasi, A high-performance source engineered charge plasma-based schottky MOSFET on SOI. IEEE Trans. on Electron Devices 62(10), 3357 (2015)
S.K. Srivastava, A.K. Shukla, V.D. Vankar, V. Kumar, Growth, structure and field emission characteristics of petal like carbon nano-structured thin films. Thin Solid Films 492(1–2), 124–130 (2005). https://doi.org/10.1016/j.tsf.2005.07.283
X. Yang, K. Mohanram, Modeling and performance investigation of the double-gate carbon nanotube transistor. IEEE Electron Device Lett. 32(3), 231–233 (2011). https://doi.org/10.1109/LED.2010.2095826
ATLAS User’s Guide, SILVACO Int., Santa Clara, CA, USA, Version 5.26.1.R; (2018)
L. Liu, C. Qiu, D. Zhong, J. Si, Z. Zhang, L.-M. Peng, Scaling down contact length in complementary carbon nanotube field-effect transistors. Nanoscale 9(27), 9615–9621 (2017)
G. Jo, J. Maeng, T.-W. Kim, W.-K. Hong, B.-S. Choi, T. Lee, Channel-length and gate-bias dependence of contact resistance and mobility for In2O3 nanowire field effect transistors. J. Appl. Phys. 102(8), 084508 (2007)
R. Martel, T. Schmidt, H.R. Shea, T. Hertel, Ph. Avouris, Single- and multi-wall carbon nanotube field-effect transistors. Appl. Phys. Lett. 73, 2447 (1998)
M.H. Moaiyeri, F. Razi, Performance analysis and enhancement of 10-nm GAA CNTFET-based circuits in the presence of CNT-metal contact resistance. J Comput. Electron. 16, 240–252 (2017)
S.M. Sze, K.K. Ng, Physics of Semiconductor Devices (Wiley, New York, 2006)
K Ostrikov Xu Shuyan P-A Nanofabrication (2007). From Plasma Sources to Nanoassembly, Wiley-VCH Germany https://doi.org/10.1002/9783527611553
G.J. Brady, A.J. Way, N.S. Safron, H.T. Evensen, P. Gopalan, M.S. Arnold, Quasi-ballistic carbon nanotube array transistors with current density exceeding Si and GaAs. Sci. Adv. 2(9), e1601240–e1601240 (2016). https://doi.org/10.1126/sciadv.1601240
A. Graham, G. Duesberg, W. Hoenlein et al., How do carbon nanotubes fit into the semiconductor roadmap? Appl. Phys. A 80, 1141–1151 (2005)
A.D. Franklin, S.O. Koswatta, D.B. Farmer, J.T. Smith, L. Gignac, C.M. Breslin, J. Tersoff et al., Carbon nanotube complementary wrap-gate transistors. Nano Lett. 13(6), 2490–2495 (2013). https://doi.org/10.1021/nl400544q
T. Dang, L. Anghel, R. Leveugle, CNTFET basics and simulation. Int. Conf. Des. Test Integr. Syst. Nanoscale Technol., DTIS 2006, 28–33 (2006). https://doi.org/10.1109/DTIS.2006.1708731
S. Rewari, V. Nath, S. Haldar, S.S. Deswal, R.S. Gupta, Improved analog and AC performance with increased noise immunity using nanotube junctionless field effect transistor (NJLFET). Appl. Phys. A (2016). https://doi.org/10.1007/s00339-016-0583-9
S.S. Alabsi, A.Y. Ahmed, J.O. Dennis, M.H.M. Khir, A.S. Algamili, A review of carbon nanotubes field effect-based biosensors. IEEE Access 8, 69509–69521 (2020)
Acknowledgements
Author Mansha Kansal is thankful to Dr. Sonam Rewari for valuable discussions.
Funding
No funds, grants, or other support was received.
Author information
Authors and Affiliations
Contributions
Not Applicable.
Corresponding author
Ethics declarations
Conflict of interest
The authors declare that they have no conflict of interest.
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Kansal, M., Sharma, S.C. Plasma-based nanoarchitectonics for vertically aligned dual-metal carbon nanotube field-effect transistor (VA-DMCNFET) device: effect of plasma parameters on transistor properties. Appl. Phys. A 128, 28 (2022). https://doi.org/10.1007/s00339-021-05096-2
Received:
Accepted:
Published:
DOI: https://doi.org/10.1007/s00339-021-05096-2