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Enhanced Photoluminescence of Heavily Doped n-Ge/Si(001) Layers

  • XXIII INTERNATIONAL SYMPOSIUM “NANOPHYSICS AND NANOELECTRONICS”, NIZHNY NOVGOROD, MARCH 11–14, 2019
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Abstract

The photoluminescence spectra of epitaxial n+-Ge:P/Si(001) structures are studied. The structures are grown by hot-wire chemical vapor deposition and doped with phosphorus to the maximum electron concentration 1 × 1020 cm–3 from a source based on thermally decomposed GaP. The effects of the do** level and rapid thermal annealing of n+-Ge:P layers on the photoluminescence spectra are studied. It is demonstrated that the epitaxial n+-Ge:P/Si(001) layers grown by hot-wire chemical vapor deposition are promising for application as active regions of light-emitting optoelectronic devices operating in the near-infrared spectral region.

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Funding

The study was supported by the Russian Science Foundation, project no. 18-72-10061.

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Correspondence to D. S. Prokhorov.

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The authors declare that they have no conflict of interest.

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Translated by E. Smorgonskaya

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Prokhorov, D.S., Shengurov, V.G., Denisov, S.A. et al. Enhanced Photoluminescence of Heavily Doped n-Ge/Si(001) Layers. Semiconductors 53, 1262–1265 (2019). https://doi.org/10.1134/S1063782619090161

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  • DOI: https://doi.org/10.1134/S1063782619090161

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