A method is described for estimating spatial and temporal noise levels in phase patterns obtained using a shearing interference microscope. Experimental results are presented for a microscope operating with a coherent laser and low-coherence LED light.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
G. N. Vishnyakov, G. G. Levin, V. L. Minaev, and I. Yu. Tselmina, “Interference microscopy of subnanometer depth resolution: Numerical simulation,” Opt. Spectrosc., 116, No. 1, 170–175 (2014).
G. G. Levin, G. N. Vishnyakov, and V. L. Minaev, “An automated interference microscope for measuring dynamic objects,” Prib. Tekh. Eksper., No. 1, 79–84 (201 4).
G. Vishnyakov, G. Levin, V. Minaev, and N. Nekrasov, “Advanced method of phase shift measurement from variances of interferogram differences,” Appl. Opt., 54, No. 15, 4797–4804 (2015).
T. H. Nguyen and G. Popescu, “Spatial Light Interference Microscopy (SLIM) using twisted-nematic liquid-crystal modulation,” Biomed. Opt. Expr., 4, No. 9, 1571–1583 (2013).
P. Girshovitz and N. T. Shaked, “Compact and portable low-coherence interferometer with off-axis geometry for quantitative phase microscopy and nanoscopy,” Opt. Expr., 21, No. 5, 5701–5714 (2013).
Author information
Authors and Affiliations
Corresponding author
Additional information
Translated from Izmeritel’naya Tekhnika, No. 11, pp. 38–40, November, 2015.
Rights and permissions
About this article
Cite this article
Latushko, M.I. Noise Level Estimation in Phase Images Obtained Using a Shearing Interference Microscope. Meas Tech 58, 1234–1237 (2016). https://doi.org/10.1007/s11018-016-0876-6
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11018-016-0876-6