Abstract
Shearography and other applications of Electronic Speckle Pattern Interferometry (ESPI) are typically done using a single monochromatic light source with a monochrome camera. This arrangement enables full-field measurements of a single deformation quantity according to the particular arrangement of the optical system. If a further deformation quantity is to be measured, then the associated optical arrangement must be used sequentially. Here, an alternative approach is described where multiple interferometric measurements are simultaneously made using a color camera imaging monochromatic light sources of different wavelengths. The Red-Green-Blue (RGB) sensors of a conventional Bayer type camera can be read separately, thereby providing three independent color signals and independent ESPI phase maps. This technique is applied here to extend the measurement opportunities available with phase-step** shearography.
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Acknowledgments
The authors sincerely thank the Natural Sciences and Engineering Research Council of Canada (NSERC), American Stress Technologies, Inc., Pittsburgh, PA, and the Institute for Computing, Information and Cognitive Systems (ICICS), Vancouver, Canada, for financially supporting this research.
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Richoz, G., Schajer, G.S. Simultaneous Phase-Step** Shearography Measurements Using Multiple Wavelengths and a Color Camera. Exp Mech 55, 1165–1174 (2015). https://doi.org/10.1007/s11340-015-0022-4
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DOI: https://doi.org/10.1007/s11340-015-0022-4