Abstract
This research work conveys the computational analysis of hafnium (IV) oxide and its doped crystal by Si, Ge and Sn replacing on the oxygen atom in HfO2, as hafnium (IV) oxide has been used in power-electronics devices of MOSFETs and electronics as RRAM due to wide band gap which makes a vast problems creating high resistances. Regarding this case, the hafnium (IV) oxide has selected inputs how the band gap has decreased later than do** by the large surface area atoms, such as Si, Ge and Sn. The first principle method in view of density functional theory (DFT) expresses the structural geometry, electronic structure and optical properties utilizing conformist calculations pertaining to HfO2 executing the computational avenue of the CASTAP regulation from material studio 8.0. The band gap was found in 4.340 eV, 2.033 eV, 1.686 eV and 3.210 eV for HfO2, Hf0.88Si0.12O2 Hf0.88Ge0.12O2 and Hf0.88Sn0.12O2 crystals through the Generalized Gradient Approximation (GGA) with Perdew Burke Ernzerhof (PBE), and the DFT and PDOS were simulated for evaluating the nature of 6s2, 5p6, 4f14, 5d2 orbital for a Hf atom, 3s2, 2p6 orbital for Si atom, 4s2,3p6, 3d10 orbital for Ge atom, 4d10, 5s2, 5p2 for Sn atom, 2s and 2p orbital for O atom of Hf0.88Ge0.12O2 and Hf0.88Sn0.12O2 crystals. The optical properties, for instance, absorption, reflection, refractive index, conductivity, dielectric function and loss function, were calculated.
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References
Colinge, J.-P.: Multiple-gate soi mosfets. Solid-State Electron. 48, 897–905 (2004)
Lundstrom, M., Ren, Z.: Essential physics of carrier transport in nanoscale MOSFETs. IEEE Trans. Electron Devices 49, 133–141 (2002)
Lee, H.C., Chen. P.S., Wu, T.Y., Chen, Y.S., Wang, C.C., Tzeng, P.J., Lin, C.H., Chen, F., Lien, C.H., Tsai, M.-J.: Low power and high speed bipolar switching with a thin reactive Ti buffer layer in robust HfO2 based RRAM. In: 2008 IEEE International Electron Devices Meeting, pp. 1–4 (2008)
Jagannathan, H.N., Narayanan, V., Brown, S.: Engineering high dielectric constant materials for band-edge CMOS applications. ECS Trans. 16, 19 (2008)
Fantini, A., Wouters, D.J., Degraeve, R., Goux, L., Pantisano, L., Kar, G., Chen, Y.-Y., Govoreanu, B., Kittl, J.A., Altimime, L.: Intrinsic switching behavior in HfO2 RRAM by fast electrical measurements on novel 2R test structures. In: 2012 4th IEEE International Memory Workshop, pp. 1–4 (2012)
Francescon, P., Cora, S., Cavedon, C., Scalchi, P., Reccanello, S., Colombo, F.: Use of a new type of radiochromic film, a new parallel‐plate micro‐chamber, MOSFETs, and TLD 800 microcubes in the dosimetry of small beams. Med. Phys. 25, 503–511 (1998)
Stella, C., Laudani, M., Gaito, A., Nania, M.: Advantage of the use of an added driver source lead in discrete power MOSFETs. In: 2014 IEEE Applied Power Electronics Conference and Exposition-APEC 2014, pp. 2574–2581 (2014)
Picard, C., Brisset, C., Hoffmann, A., Charles, J.-P., Joffre, F.,Adams, L., Siedle, A.H.: Use of electrical stress and isochronal annealing on power MOSFETs in order to characterize the effects of 60Co irradiation. Microelectronics Reliab. 40, 1647–1652 (2000)
Öttking, R., Kupke, S., Steve, Nadimi, E., Leitsmann, R., Lazarevic, F., Plänitz, P., Roll, G., Slesazeck, S., Trentzsch, M., Mikolajick, T.: Defect generation and activation processes in HfO2 thin films: contributions to stress-induced leakage currents. Physica Status Solidi (A) 212, 547–553 (2015)
Puglisi, F.M., Pavan, P., Larcher, L., Padovani, A.: Statistical analysis of random telegraph noise in HfO2-based RRAM devices in LRS. Solid-State Electronics 113, 132–137 (2015)
Pan, J.N.: Optoelectronic CMOS transistors: performance advantages for sub-7nm ULSI, RF ASIC, memories, and power MOSFETs. MRS Adv. 4, 2585–2591 (2019)
Min, B., Devireddy, S.P., Çelik-Butler, Z., Wang, F., Zlotnicka, A., Tseng, H.-H., Tobin, P.J.: Low-frequency noise in submicrometer MOSFETs with HfO2, HfO2/Al2O3 and HfAlOx gate stacks. IEEE Trans. Electron Devices 51, 1679–1687 (2004)
Fantini, A.: Intrinsic program instability in HfO2 RRAM and consequences on program algorithms. In: 2015 IEEE International Electron Devices Meeting (IEDM), pp. 7.5.1–7.5.4 (2015)
Kumar, A., Chakma, U.: Develo** the amazing photocatalyst of ZnAg2GeSe4, ZnAg2Ge0.93Fe0.07Se4 and ZnAg2Ge0.86Fe0.14Se4 through the computational explorations by four DFT functionals. Heliyon 7, e07467 (2021)
Al Mamun, A., Monsur Alam, M., Habib, A., Chakma, U., Sikder, M., Kumer, A.: Structural, electronic, optical properties and molecular dynamics study of WO3 W0. 97Ag0. 03O3 and W0.94Ag0.06O3 photocatalyst by the first principle of DFT study. Egyptian J. Chem. 63 (2021)
Ali, M., Islam, M.J., Rafid, M., Jeetu, R.R., Roy, R., Chakma, U., Kumer, A.: The computational screening of structural, electronic, and optical properties for SiC, Si0.94Sn0.06C, and Si0.88Sn0.12C lead-free photovoltaic inverters using DFT functional of first principle approach. Eurasian Chem. Commun. 3, 327–338 (2021)
Hasan, M.M., Kumer, A., Chakma, U.: Theoretical investigation of do** effect of Fe for SnWO4 in electronic structure and optical properties: DFT based first principle study. Adv. J. Chem.-Section A 03, 639–644 (2020)
Howlader, D., Hossain M.S., Chakma, U., Kumer, A., Islam, M.J., Islam, M.T., Hossain, T., Islam, J.: Structural geometry, electronic structure, thermo-electronic and optical properties of GaCuO2 and GaCu0.94Fe0.06O2: a first principle approach of three DFT functionals. Mol. Simul. 44, 1–12 (2021). https://doi.org/10.1080/08927022.2021.1977295
Islam, M.T., Kumer, A., Howlader, D., Chakma, K.B., Chakma, U.: Electronics structure and optical properties of Mg(BiO2)4 and Mg(Bi0.91Ge0.083O2)4: a first principle approach. Turk. Comput. Theor. Chem. 4, 24–31 (2020)
Chakma, K.B., Kumer, A., Chakma, U., Howlader, D., Islam, M.T.: A theoretical investigation for electronics structure of Mg(BiO2)2 semiconductor using first principle approach. Int. J. New Chem. 7, 247–255 (2020)
Sikder, M.A.M., Chakma, U., Kumer, A., Islam, M.J., Habib, A., Alam, M.M.: The exploration of structural, electronic and optical properties for MoS2 and Mo0.95W0.05S2 photocatalyst effort on wastewater treatment using DFT functional of first principle approach. Appl. J. Environ. Eng. Sci. 7, 103–113 (2021)
Islam, M.T., Kumer, A., Chakma, U., Howlader, D.: A computational investigation of electronic structure and optical properties of AlCuO2 and AlCu0.96Fe0.04O2: a first principle approach. Orbital: Electron. J. Chem. 13 (2021)
Perdew, J.P., Burke, K., Ernzerhof, M.: Generalized gradient approximation made simple. Phys. Rev. Lett. 77, 3865 (1996)
Ali, M., Islam, M. J., Kumer, A., Hossain, M., Chakma, U., Howlader, D., Islam, M., Hossain, T.: Investigation of structural, electronic and optical properties of Na2InAgCl6, K2InAgCl 6, and Rb2InAgCl 6 Lead-free halide double Perovskites regarding with Cs2InAgCl6 Perovskites cell and a comparative study by DFT functionals. Mater. Res. 24 (2021)
Alam, M.M., Chakma, U., Kumer, A., Islam, M.S., Khandaker, N.Z., Hossain, T., Chakma, P., Uddin, J.: Investigation of structural, electronic, and optical properties of CdAg2GeSe4 and HgAg2GeSe4 amazing photocatalyst regarding with ZnAg2GeSe4 and a comparative study by DFT functionals. SPAST Abstracts 1 (2021)
Howlader, D., Hossain, M.S., Chakma, U., Kumer, A., Islam, M.J., Islam, M.T., Hossain, T., Islam, J.: Structural geometry, electronic structure, thermo-electronic and optical properties of GaCuO2 and GaCu0.94Fe0.06O2: a first principle approach of three DFT functionals. Mol. Simul. 47, 1411–1422 (2021)
Zhu, H., Tang, C., Fonseca, L.R.C., Ramprasad, R.: Recent progress in ab initio simulations of hafnia-based gate stacks. J. Mater. Sci. 47, 7399–7416 (2012)
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Chakma, U. et al. (2023). Exploration of Electronic Structure and Optical Properties Hafnium (IV) Oxide and Its 12% Si, Ge and Sn with Material Data Analysis by Computational Methods. In: Hossain, M.S., Majumder, S.P., Siddique, N., Hossain, M.S. (eds) The Fourth Industrial Revolution and Beyond. Lecture Notes in Electrical Engineering, vol 980. Springer, Singapore. https://doi.org/10.1007/978-981-19-8032-9_18
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DOI: https://doi.org/10.1007/978-981-19-8032-9_18
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