Analysis of Degradation Related to Encapsulation

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Handbook of Organic Light-Emitting Diodes

Abstract

Degradation caused by permeated moisture is the most serious problem facing flexible organic light-emitting diodes (OLEDs). Even extremely small quantities of water can corrode the inner wiring materials, and deteriorate the organic layer in the OLED. In order to design a reliable OLED device, experimental investigations are needed to evaluate sealing capacity of fabricated devices.

In this chapter, we describe measurement techniques for evaluating the sealing capacity. Evaluation of encapsulation performance is carried out by SIMS and hermetic package analysis.

Comparisons of three water-vapor transmission-rate (WVTR) measurement systems based on different methods are performed in order to establish a reliable WVTR measurement technique. An evaluation technique for determining the WVTR is also developed using our reference films with multiple strategically created pinholes.

A reliable evaluation method applicable to flexible OLEDs is developed to quantify water penetration from an adhesive edge face. The adhesive’s apparent water diffusion coefficient obtained by this method provides the water penetration time and elucidates the pathway. Moreover, the proposed method can predict the start time of degradation.

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Acknowledgments

This work was partly carried out under “Development of Fundamental Evaluation Technology for Next-generation chemical Materials” commissioned by the New Energy and Industrial Technology Development Organization (NEDO), Japan.

This manuscript is the same content that we presented in SID display week 2015 (Ohzu et al. 2015).

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Correspondence to Takahiro Mino , Akira Suzuki or Yoshiko Ohzu .

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Mino, T. et al. (2021). Analysis of Degradation Related to Encapsulation. In: Adachi, C., Hattori, R., Kaji, H., Tsujimura, T. (eds) Handbook of Organic Light-Emitting Diodes. Springer, Tokyo. https://doi.org/10.1007/978-4-431-55761-6_30-1

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  • DOI: https://doi.org/10.1007/978-4-431-55761-6_30-1

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