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  1. Scanning Electron Microscope Training

    The scanning electron microscope (SEM) is a microscope that uses electrons instead of light to form an image. The learning objective of this chapter...
    Mark Tehranipoor, N. Nalla Anandakumar, Farimah Farahmandi in Hardware Security Training, Hands-on!
    Chapter 2023
  2. Transmission Electron Microscope

    In this chapter we discuss the essential components of a transmission electron microscope. The components can be divided into (i) illumination...
    Gunturi Venkata Sitarama Sastry in Microstructural Characterisation Techniques
    Chapter 2022
  3. Electron Microscopy

    The observations made by Robert Hooke (1635–1703) and Antonie van Leeuwenhoek (1632–1723) with the first optical microscope awakened man’s will to...
    Marziale Milani, Roberta Curia, ... Francesco Tatti in Bacterial Degradation of Organic and Inorganic Materials
    Chapter 2023
  4. Quantitative phase imaging with a compact meta-microscope

    Quantitative phase imaging (QPI) based on the transport-of-intensity equation (TIE) is a powerful technique in label-free microscopy. The image stack...

    Junyi Wang, Rongtao Yu, ... Tao Li in npj Nanophotonics
    Article Open access 08 April 2024
  5. Electron crystals come under the microscope

    Carmen Rubio-Verdú in Nature
    Article 29 September 2021
  6. Lensless Electron Microscopy

    A set of three microscopes can be considered as an illustrative list of microscopes which form images of a specimen without the aid of any objective...
    Gunturi Venkata Sitarama Sastry in Microstructural Characterisation Techniques
    Chapter 2022
  7. Electron Microscopy: Principle, Components, Optics and Specimen Processing

    An electron microscope (EM) uses a high energy electron beam aa s probe instead of visible light. The electrons have a shorter wavelength and provide...
    Chapter 2022
  8. In-Situ Gas Transmission Electron Microscopy

    One of the most nonnegligible characters of a Transmission Electron Microscope (TEM) is that the interior chamber which contains an electron source,...
    Ke Fang, Wentao Yuan, ... Yong Wang in In-Situ Transmission Electron Microscopy
    Chapter 2023
  9. Observation of Bacteriophage Ultrastructure by Cryo-Electron Microscopy

    Transmission electron microscopy (TEM) is an ideal method to observe and determine the structure of bacteriophages. From early studies by negative...
    Ana Cuervo, Patricia Losana, José L. Carrascosa in Bacteriophage Therapy
    Protocol 2024
  10. Electron Probe Microanalysiswith Cryogenic Detectors

    Electron probe X-ray microanalysis (EPMA) is based upon the use of a focused, high current density electron beam, 5 to 30 keV in energy, to excite...
    D.E. Newbury, K.D. Irwin, ... J.M. Martinis in Cryogenic Particle Detection
    Chapter
  11. Electrical Measurement by Multiple-Probe Scanning Probe Microscope

    In this chapter, we will overview the electrical measurement by using multiple-probe scanning probe microscope (MP-SPM). The MP-SPM is a powerful...
    Yoshitaka Shingaya, Tomonobu Nakayama in System-Materials Nanoarchitectonics
    Chapter 2022
  12. Scanning Electron Microscopic Analysis of the Bone-Resorption Activity in Mature Osteoclasts

    Bone homeostasis depends on the balance between bone deposition and bone resorption, which are mediated by the activity of osteoblasts and...
    Takeshi Kiyoi in Rheumatoid Arthritis
    Protocol 2024
  13. Electron Microscopy for Visualization of Interfaces in Adhesion and Adhesive Bonding

    This chapter provides an overview of electron microscopy techniques to investigate interfaces in polymeric materials and adhesive bonds. First, how...
    Chapter Open access 2024
  14. Material surface characterization using low-energy electron microscopy and photoemission electron microscopy

    We describe a state-of-the-art surface imaging and material characterization facility recently established for advanced structural, morphological,...

    S. R. Mohanty, S. Paul, K. S. R. Menon in Indian Journal of Physics
    Article 16 January 2023
  15. Scanning Electron Microscopy

    Living reference work entry 2023
  16. 6H–SiC Nanoparticles Integrated with an Atomic Force Microscope for Scanning Quantum Sensors

    We fabricate a quantum magnetic field sensor based on the silicon vacancy centers in 6H–SiC using atomic force microscopy technique. The quantum...

    K. V. Likhachev, I. D. Breev, ... A. N. Anisimov in JETP Letters
    Article Open access 29 November 2022
  17. Scanning Electron Microscopy (SEM)

    Scanning electron microscopy (SEM) is perhaps the first technique a catalyst researcher should use to start characterizing a catalyst. In this...
    Chapter 2023
  18. Transmission Electron Microscopic Methods for Plant Virology

    Transmission electron microscopy (TEM) is an important tool for observing the ultrastructure of plant virions and their host cells. The two main...
    Li **e, Jian Hong in Plant Virology
    Protocol 2022
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