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  1. No Access

    Article

    Scanning Electron Microscope Investigation of Aluminum Foils for Electrical Applications

    The recent availability of the scanning electron microscope (SEM) has presented a unique instrument for the investigation of surface detail and structures that was previously impossible. SEM photographs of goo...

    W. D. Bingle, C. C. Manzonelli in JOM (1971)

  2. No Access

    Chapter and Conference Paper

    Industrial Applications of Microprobe Analysis

    Electron probe X-ray microanalysis has revealed a new realm of analytical investigations on a microscopic scale. But while the microprobe permits high precision in strictly quantitative analysis, such precisio...

    B. R. Banerjee, W. D. Bingle in Developments in Applied Spectroscopy (1964)

  3. No Access

    Article

    Scanning Electron-Probe Microanalysis In The Metals Industry

    Typical applications of the scanning microana-lyzer to the analysis of multiphase structures and compositional heterogeneity encountered in commercial materials are discussed. Instrumental considerations of th...

    B. R. Banerjee, W. D. Bingle, N. S. Blake in JOM (1963)