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  1. No Access

    Article

    New Fixed Point for an in-Orbit Calibration Scale Developed on the Basis of In–Bi Eutectic Alloy for Use in New-Generation Highly Stable Onboard Reference Sources

    The paper discusses a problem associated with ensuring the stability of Earth-observing satellite instruments performing long-term temperature measurements within the thermal infrared spectral range. Reliable ...

    A. A. Burdakin, V. R. Gavrilov, E. A. Us, V. S. Bormashov in Measurement Techniques (2021)

  2. No Access

    Article

    First-Class State Working Standard of Units of Wavelength in the Range from 1.25 to 20.00 μm and of Wavenumber in the Range from 500 to 8000 cm–1

    The first-class State Working Standard of units of wavelength in the range from 1.25 to 20.00 μm and of units of wavenumber in the range from 500 to 8000 cm–1 developed at the All-Russia Research Institute of Opt...

    A. Yu. Dunaev, V. S. Bormashov, S. P. Morozova, V. R. Gavrilov in Measurement Techniques (2021)

  3. No Access

    Article

    Ellipsometric Technique for Estimating the Thickness Nonuniformity of Thin-Film Coatings

    An ellipsometric technique is proposed for estimating the thickness uniformity of thin film coatings in the range of 5–150 nm.

    A. S. Baturin, V. S. Bormashov, V. P. Gavrilenko… in Measurement Techniques (2014)

  4. No Access

    Article

    Reference samples for the spatial characteristics of nanostructures based on amorphous multilayer coatings

    The development of the reference samples SPAM-20 and SPAM-100 for the spatial characteristics of nanostructures, based on periodic multilayer Al2O3/TiO2 coatings and intended for monitoring measurement accuracy a...

    A. S. Baturin, V. S. Bormashov, M. A. Ermakova, E. A. Morozova… in Measurement Techniques (2013)

  5. No Access

    Article

    Determination of the nonlinearity of capacitive sensors along the Z-axis of an atomic force microscope

    The nonlinearity of capacitive sensors along the Z-axis of an atomic force microscope is investigated using test structures containing relief elements of height 300–1200 nm. The dependence of the results of he...

    A. V. Zablotskii, V. A. Sharonov, V. S. Bormashov, A. S. Baturin… in Measurement Techniques (2013)