![Loading...](https://link.springer.com/static/c4a417b97a76cc2980e3c25e2271af3129e08bbe/images/pdf-preview/spacer.gif)
-
Chapter and Conference Paper
Pixel Detector Developments for Tracker Upgrades of the High Luminosity LHC
This paper reports on the INFN (Istituto Nazionale di Fisica Nucleare, Italy) research activity in collaboration with FBK foundry, which is aiming at the development of new pixel detectors for the LHC Phase-2 ...
-
Article
Through wafer via holes manufacturing by variable isotropy Deep RIE process for RF applications
This paper reports a method on the manufacturing of through silicon wafer via holes with tapered walls by Deep Reactive Ion Etching using the opportunity to change the isotropy in the DRIE equipments during pr...
-
Article
Erbium-Activated Silica-Titania Planar Waveguides
(100 − x)SiO2-(x)TiO2-ErO3/2 planar waveguides, with 7 ≤ x ≤ 20 have been prepared by sol-gel route using the dip-coating technique. The thickness of the films was optimized to support a single propagating mode a...
-
Article
Er3+/Yb3+ Co-Activated Silica-Alumina Monolithic Xerogels
Monolithic silica xerogels doped with different concentrations of Er3+, Yb3+ and Al3+ were prepared by sol-gel route. Densification was achieved by thermal treatment in air at 950°C for 120 h with a heating rate ...
-
Article
Er-doped silica-based waveguides prepared by different techniques: RF-sputtering, sol-gel and ion-exchange
Erbium-activated silica-based planar waveguides were prepared by three different technological routes: RF-sputtering, sol–gel and ion exchange. Various parameters of preparation were varied in order to optimiz...
-
Article
Metal nanocluster formation in silica films prepared by rf-sputtering: an experimental study
Composite silica films containing metal nanoclusters were prepared by the rf- sputtering technique, in which SiO2 was co-deposited with gold+copper, gold+silver, or copper+silver. The formation of either pure or ...
-
Article
Influence of the Er3+ Content on the Luminescence Properties and on the Structure of Er2O3-SiO2 Xerogels
Er2O3-SiO2 xerogels doped with different Er/Si concentrations were annealed at 950°C for 120 h. The Er3+ do** level varied from 0 to 40000 Er/Si ppm. The effect of Er2O3 content on the sintering behavior of sil...