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  1. Article

    Open Access

    Simulating the fabrication of aluminium oxide tunnel junctions

    Aluminium oxide (AlOx) tunnel junctions are important components in a range of nanoelectric devices including superconducting qubits where they can be used as Josephson junctions. While many improvements in the r...

    M. J. Cyster, J. S. Smith, N. Vogt, G. Opletal, S. P. Russo… in npj Quantum Information (2021)

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  2. Article

    Open Access

    Ab initio calculation of energy levels for phosphorus donors in silicon

    The s manifold energy levels for phosphorus donors in silicon are important input parameters for the design and modeling of electronic devices on the nanoscale. In this paper we calculate these energy levels from...

    J. S. Smith, A. Budi, M. C. Per, N. Vogt, D. W. Drumm… in Scientific Reports (2017)

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    Article

    The effect of grain refining on macrosegregation and dendrite arm spacing of direct chill cast AA5182

    The effect of titanium and titanium diboride inoculation on the spatial variation of local solidification time for direct chill (DC) cast ingots of aluminum alloy 5182 (AA5182) was studied. The results have be...

    A. M. Glenn, S. P. Russo, P. J. K. Paterson in Metallurgical and Materials Transactions A (2003)

  4. No Access

    Article

    Hydrogen Stabilization of {111} Nanodiamond

    Presented here are results of ab initio Density Functional Theory (DFT) structural relaxations performed on dehydrogenated and monohydrogenated nanocrystalline diamond structures of octahedral {111} and cuboct...

    A. S. Barnard, N. A. Marks, S. P. Russo, I. K. Snook in MRS Online Proceedings Library (2003)

  5. No Access

    Article

    Analysis of Faceted Growth Hillocks in MOCVD Grown Epitaxial HgCdTe on GaAs with a Nuclear Microprobe

    Hg1−xCdxTe epitaxial layers on GaAs substrates grown by Metal Organic Chemical Vapour Deposition (MOCVD) display growth defects resembling pyramidal faceted hillocks which appear to originate from defects origina...

    David N. Jamieson, S. P. Dooley, S. P. Russo… in MRS Online Proceedings Library (1991)

  6. No Access

    Article

    Rbs and Pixe Analysis Of Hg1-xCdxTe grown by MOCVD.

    The techniques, Particle Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS) have been used to investigate compositional and thickness uniformity of Hg1-xCdxTe (MCT) grown on GaAs subst...

    S. P. Russo, R. G. Elliman, P. N. Johnston, G. N. Pain in MRS Online Proceedings Library (1990)