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    Segregation Effect and its Influence on Grain Boundary Diffusion in Thin Metallic Films

    The diffusion in Au-Cu and Pt-Cu thin films has been studied by Rutherford backscattering spectrometry (RBS) under the kinetic regime “B” (within the temperature interval of 175–290°C) and “C” (room temperatur...

    A. N. Aleshin, B. S. Bokstein, V. K. Egorov, P. V. Kurkin in MRS Online Proceedings Library (1994)