-
Chapter
Field Dependence of Time-To-Breakdown Distribution of Thin Oxides
The accurate prediction of thin insulator reliability is of significant importance to the development of MOS VLSI technologies. In most reliability studies1,5, the time-to-failure tbd and/or the total injected ch...
-
Article
Fault simulation for general FCMOS ICs
This work presents a technique to correctly deal with non-stuck-at faults in FCMOS circuits making use of complex macrogates. This method can be applied to any gate-level fault simulator providing, for each li...
-
Article
Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults
This work presents a design technique for CMOS static and dynamic checkers (to be used in self-checking circuits), that allows the detection of all internal single transistor stuck-on and bridging faults causi...
-
Chapter
Reliability in Wireless Systems
Cell phones represent a quite recent personal communication system, dating back only about 25 years. Initially the installation costs of the network infrastructures, the service, and the cellular phones, limit...
-
Article
Dynamical analysis of the induced fission time obtained by the crystal blocking technique for the 235U + α reaction
The crystal blocking technique has been used to measure the total time of the induced fission process for the 235U + α reaction in the energy rage of bombarding α-particles from 25.9 to 31.2 MeV. The experimental...
-
Chapter
Reliability issues of NAND Flash memories
The continuous demand for NAND flash memories with higher performance and storage capabilities pushes the manufactures towards the limits of present technologies and to explore new solutions, both from the phy...
-
Chapter
SSD Reliability
SSD are complex electronic systems prone to wear-out and failure mechanisms mainly related to their basic component: the Flash memory. The reliability of a Flash memory depends on many technological and archit...
-
Chapter
Reliability of 3D NAND Flash Memories
In this chapter the main reliability mechanisms affecting 3D NAND memories will be addressed, providing a comparison between 3D FG and 3D CT devices in terms of reliability and expected performances. Starting ...
-
Chapter
SSD Reliability Assessment and Improvement
Solid State Drives (SSDs) are one of the electronic systems with the highest development rate in the last decade [1]. Their adoption as a hard disk drive (HDD) replacement in hyper scale environments like clou...
-
Chapter
Memory Driven Design Methodologies for Optimal SSD Performance
Solid State Drives (SSDs) are one of the electronic systems with the higher development rate in the last decade: they are widely used in hyper scale systems such as cloud computing and big data servers where p...
-
Chapter
Machine Learning for 3D NAND Flash and Solid State Drives Reliability/Performance Optimization
are the storage backbone of many applications ranging from consumer electronics up to exa-scaled data centers (Zuolo in Proc IEEE 105:1589–1608, 2017). As such, the performances should be improved to reduce...
