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  1. No Access

    Article

    Fault simulation for general FCMOS ICs

    This work presents a technique to correctly deal with non-stuck-at faults in FCMOS circuits making use of complex macrogates. This method can be applied to any gate-level fault simulator providing, for each li...

    M. Favalli, P. Olivo, B. Riccò, F. Somenzi in Journal of Electronic Testing (1991)

  2. No Access

    Article

    Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults

    This work presents a design technique for CMOS static and dynamic checkers (to be used in self-checking circuits), that allows the detection of all internal single transistor stuck-on and bridging faults causi...

    C. Metra, M. Favalli, P. Olivo, B. Riccò in Journal of Electronic Testing (1995)

  3. No Access

    Chapter

    Reliability in Wireless Systems

    Cell phones represent a quite recent personal communication system, dating back only about 25 years. Initially the installation costs of the network infrastructures, the service, and the cellular phones, limit...

    A. Chimenton, P. Olivo in Memories in Wireless Systems (2008)

  4. No Access

    Chapter

    Reliability issues of NAND Flash memories

    The continuous demand for NAND flash memories with higher performance and storage capabilities pushes the manufactures towards the limits of present technologies and to explore new solutions, both from the phy...

    C. Zambelli, A. Chimenton, P. Olivo in Inside NAND Flash Memories (2010)

  5. No Access

    Chapter

    Machine Learning for 3D NAND Flash and Solid State Drives Reliability/Performance Optimization

    are the storage backbone of many applications ranging from consumer electronics up to exa-scaled data centers (Zuolo in Proc IEEE 105:1589–1608, 2017). As such, the performances should be improved to reduce...

    Cristian Zambelli, Rino Micheloni, P. Olivo in Machine Learning and Non-volatile Memories (2022)