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  1. Article

    Open Access

    Structural characterization of poly-Si Films crystallized by Ni Metal Induced Lateral Crystallization

    The growth of the poly-Si films was studied by Transmission Electron Microscopy (TEM) after Ni Metal Induced Lateral Crystallization (Ni-MILC) of amorphous Si films at 413 °C. Significant differences in the mo...

    N. Vouroutzis, J. Stoemenos, N. Frangis, G. Z. Radnóczi, D. Knez in Scientific Reports (2019)

  2. Article

    Open Access

    Transient Photoinduced Absorption in Ultrathin As-grown Nanocrystalline Silicon Films

    We have studied ultrafast carrier dynamics in nanocrystalline silicon films with thickness of a few nanometers where boundary-related states and quantum confinement play an important role. Transient non-degene...

    Emmanouil Lioudakis, Andreas Othonos, Ch B Lioutas in Nanoscale Research Letters (2007)

  3. No Access

    Chapter and Conference Paper

    Properties of β-FeSi2 Quantum Structures Grown on Silicon

    L. Dózsa, G. Molnár, A. L. Tóth, E. Horváth in Nanostructured and Advanced Materials for … (2005)

  4. No Access

    Article

    Process Induced Extended Defects in SiC Grown via Sublimation

    Three possible situations of extended defect formation during sublimation growth of SiC have been investigated: a-plane growth, occurrence and effect of irregular growth interfaces, and development of elongate...

    R. Yakimova, M. Syväjärvi, H. Jacobson, R. R. Ciechonski in MRS Online Proceedings Library (2003)

  5. No Access

    Chapter

    Incommensurate — Commensurate Phase Transition of Cu2-×Te. (x < 0.05)

    In the temperature range 25ºC to 600°C, Cu2-×Te (x<0.05) undergoes a sequence of phase transformations schematically shown in Fig. 1.1 The highest temperature phase (∊-phase) and the one stable at room tempera...

    N. Vouroutzis, C. Manolikas in Geometry and Thermodynamics (1990)