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  1. No Access

    Article

    Interface Stress and An Apparent Negative Poisson’s Ratio in Ag/Ni Multilayers

    By use of dc-magnetron sputtering, (111) textured Ag/Ni multilayered thin films were deposited with nominal bilayer repeat lengths ranging from 2 nm to 250 nm. Bulk and interface stresses were obtained from X-...

    K. O. Schweitz, H. Geisler, J. Chevallier, J. Bøttiger… in MRS Online Proceedings Library (1997)

  2. No Access

    Article

    The Influence of Contact Composition, Pretreatment, and Annealing Gas on the Ohmic Behavior of Ti/Al-Based Ohmic Contacts to n-Al 0.4Ga 0.6N

    As the group III nitride semiconductor technology matures, an increasing number of devices are being fabricated with high Al fraction AlGaN. In this study, ohmic behavior is achieved using Ti/Al/Pt/Au contacts...

    K. O. Schweitz, T. G. Pribicko, S. E. Mohney… in MRS Online Proceedings Library (2011)