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Article
Toughness measurement of thin films based on circumferential cracks induced at conical indentation
In the present study, circumferential ring cracks were produced in two types of alumina coatings under conical indentation. The alumina coatings were produced using reactive dual pulsed magnetron sputtering. T...
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Article
The dependence of the nanostructure of magnetron sputtered Cu–Ag alloy films on composition and temperature
Cu–Ag alloy films prepared by magnetron cosputtering were characterized by using x-ray diffraction. A two-phase nanocrystalline structure of Cu grains supersaturated with Ag and Ag grains saturated with Cu was...
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Article
Influence of the substrate bias on the size and thermal stability of grains in magnetron-sputtered nanocrystalline Ag films
The nanostructural evolution during heat treatments of direct-current magnetronsputtered Ag films, deposited at room temperature at different substrate bias voltages, was experimentally studied. A growth chamb...
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Article
On the development of the <111> fiber texture in nanocrystalline gold during growth and annealing
The evolution during growth and subsequent annealing of the <111> fiber texture in magnetron-sputtered nanocrystalline Au films has been studied experimentally using X-ray diffraction with synchrotron radiatio...
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Article
Measured and calculated thermoelastic properties of supersaturated fcc Ni(Al) and Ni(Zr) solid solutions
Metastable face-centered cubic (fcc) solid solutions of Ni1–xAlx and Ni1–xZrx have been prepared in thin-film form using dc planar magnetron sputtering in a UHV system. In both these alloy systems, extended solub...
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Article
Interface Stress and An Apparent Negative Poisson’s Ratio in Ag/Ni Multilayers
By use of dc-magnetron sputtering, (111) textured Ag/Ni multilayered thin films were deposited with nominal bilayer repeat lengths ranging from 2 nm to 250 nm. Bulk and interface stresses were obtained from X-...
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Article
Elastic Modulus and Hardness as Derived from Nanoindentation of Ni and Mo Films Prepared by Ion Beam Assisted Deposition
Using ion beam assisted deposition, 1.5-2.2 μm thick molybdenum and nickel films were prepared on silicon substrates. Some films were found to be strongly textured. By changing the rate of Ar+ bombardment during ...
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Article
On the chemical diffusion in layered thin films containing amorphous Co–Zr, Ni–Zr, and Fe–Zr
The chemical diffusion in thin trilayer films of TM–TM100−xZrx–TM with an amorphous middle layer where TM = Co, Ni, or Fe and in amorphous Fe–Zr and Ni–Zr films with composition gradients has been investigated us...
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Article
Diffusional Asymmetry in Amorphous Alloys: Implications for Interfacial Reactions
Early/late transition metal systems such as Ni-Zr and Co-Zr exhibit solid state amorphization (SSA) in which the amorphous phase is formed by reaction between the crystalline elements. The rate of the amorphiz...
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Article
On the Phase Formation During Ion-Beam Mixing
The phase formation during ion-beam mixing of binary transition-metal alloys has been studied by use of Xe* , Ar* , and Ne* as a function of temperature and composition. Especially the compositio...
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Article
Effects on Metal/Metal-Oxide Interface Adhesion Due to Electron and Ion Irradiation
The influence of electron and ion irradiation on the adhesion at chromium-copper thin film interfaces has been studied. The measurements were carried out with different types and thicknesses of well-characteri...
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Article
Ion Beam Enhanced Adhesion of Thin Films
Ion beam enhanced adhesion has been studied for the case of thin Cu films deposited on substrates of alumina, fused quartz and glass-ceramic. Beams of He+ (200 keV) and Ne+ (280 keV) were used, in order to test t...
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Article
Short- and long-range ion-beam mixing in Cu:Al
Ion-beam mixing by 500-keV xenon ions has been studied in targets consisting of 2000-Å films of aluminium on a polycrystalline aluminium substrate, onto which has been evaporated a 500-Å overlayer of copper. B...
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Chapter
Depth Profiling of Light Isotopes by use of Nuclear Reactions
By analyses using nuclear reactions, the depth distributions and the absolute amount of traces of light isotopes (Z ≲ 15) within the near-surface region can be measured. The nuclear-reaction methods are comple...
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Chapter
Transmission Energy Spectra of Channeled Protons Scattered in Thin Silicon Films
The transmission energy spectra of 0.2 and 0.4 MeV protons scattered from thin (∿1 µm) silicon crystals have been studied as a function of sample orientation, with and without the introduction of a thin layer ...
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Chapter
Damage Profiles in Ion-Implanted Semiconductors at Low (25°K) Temperatures
The damage profiles of 300-keV Ar+ implants in Si, GaP, GaAs and InP and of 500-keV Kr+ implants in Si, GaP and Ge have been studied theoretically and experimentally. The profiles were measured using the channeli...
