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  1. No Access

    Article

    Measurements of dielectric properties of TiO2 thin films at microwave frequencies using an extended cavity perturbation technique

    This research provides a simple method to measure the dielectric properties of thin films at microwave frequencies. The cavity perturbation theory is applied to the measurement method. The measured frequency i...

    Jyh Sheen, Chueh-Yu Li, Liang-Wen Ji… in Journal of Materials Science: Materials in… (2010)

  2. No Access

    Article

    Strontium aluminum tantalum oxide and strontium aluminum niobium oxide as potential substrates for HTSC thin films

    Single crystal fibers of A(B11/2B21/2)O3 perovskites type with compositions Sr(Al1/2Ta1/2)O3 (SAT) and Sr(Al1/2Nb1/2)O3 (SAN) were grown successfully for the first time, using a laser-heated pedestal growth (LHPG...

    Ruyan Guo, A. S. Bhalla, Jyh Sheen, F. W. Ainger, S. Erdei… in Journal of Materials Research (1995)