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  1. Article

    Open Access

    Defect free strain relaxation of microcrystals on mesoporous patterned silicon

    A perfectly compliant substrate would allow the monolithic integration of high-quality semiconductor materials such as Ge and III-V on Silicon (Si) substrate, enabling novel functionalities on the well-establi...

    Alexandre Heintz, Bouraoui Ilahi, Alexandre Pofelski… in Nature Communications (2022)

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  2. No Access

    Chapter

    Analytical Electron Microscopy

    Analytical electron microscopy ( ) refers to a collection of spectroscopic techniques that are capable of providing structural, compositional, and bonding information about samples probed by an electron beam, ...

    Gianluigi Botton, Sagar Prabhudev in Springer Handbook of Microscopy (2019)

  3. Article

    Foreword

    Matthias Militzer, Gianluigi Botton… in Metallurgical and Materials Transactions A (2017)

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  4. No Access

    Chapter

    Analytical Electron Microscopy

    The term analytical electron microscopy (AEM) refers to the collection of spectroscopic data in the transmission electron microscope (TEM) based on various signals generated following the inelastic interaction...

    Gianluigi Botton in Science of Microscopy (2007)