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  1. Article

    Open Access

    Johnson-noise-limited cancellation-free microwave impedance microscopy with monolithic silicon cantilever probes

    Microwave impedance microscopy (MIM) is an emerging scanning probe technique for nanoscale complex permittivity map** and has made significant impacts in diverse fields. To date, the most significant hurdles...

    Jun-Yi Shan, Nathaniel Morrison, Su-Di Chen, Feng Wang, Eric Y. Ma in Nature Communications (2024)

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