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    Article

    X-ray circular dichroism under reflection from antiferromagnetically coupled multilayers

    The fluorescence yield under the Bragg reflection of right and left circular polarized radiation with a wavelength in the vicinity of the FeL 2, 3 absorption edges from the periodic multilayer [Fe...

    M. A. Andreeva, E. E. Odintsova in Moscow University Physics Bulletin (2012)

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    Effect of small magnetic corrections to susceptibility on the angular dependences of the reflectivity of polarized X-rays from multilayer structures

    The X-ray resonant magnetic scattering (XRMS) method allows for the determination of optical constants including magnetic corrections, which are significant near the atomic X-ray absorption edges, by the shift...

    M. A. Andreeva, E. E. Odintsova in JETP Letters (2011)

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    Article

    Analysis of applicability of approximate methods in the theory of x-ray reflection from magnetic multilayers

    X-ray reflectivity near the absorption edges should take into account the anisotropy of X-ray susceptibility in the presence of magnetic interaction. In this paper different approaches used to calculate X-ray ...

    E. E. Odintsova, M. A. Andreeva in Journal of Surface Investigation. X-ray, S… (2010)

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    Article

    Determination of the magnetic contribution to the YFe2 susceptibility by means of X-ray resonant magnetic reflectivity

    The reflectometry curves of an Nb(4 nm)/YFe2(40 nm, 〈110〉)/Fe(1.5 nm)/Nb(50 nm) sample measured in the synchrotron radiation of right- and left-handed circular polarization for a set of wavelengths near the Y L ...

    A. Smekhova, M. A. Andreeva, E. E. Odintsova, C. Dufour in Crystallography Reports (2010)

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    Article

    Localization of an ultrathin buried Fe layer in a multilayer structure Nb/Fe/[Mo/Si]40/SiO2 by means of X-ray standing waves

    An analysis of the influence of standing waves on the angular dependencies of the fluorescent yield from an ultrathin iron layer buried inside a multilayer structure of Nb(50 nm)/Fe(3.9 nm)/[Si/Mo(6.77 nm)]40/SiO

    M. A. Andreeva, A. D. Gribova, E. E. Odintsova in Moscow University Physics Bulletin (2009)

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    Article

    Fluorescence analysis of a multilayer (Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass) structure under grazing incidence conditions

    Element-specific measurements of the fluorescent radiation combined with measurements of the reflectivity curves have been performed for a Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass sample with the use o...

    M. A. Andreeva, E. E. Odintsova in Journal of Surface Investigation. X-ray, S… (2008)