Page
%P
![Loading...](https://link.springer.com/static/c4a417b97a76cc2980e3c25e2271af3129e08bbe/images/pdf-preview/spacer.gif)
-
Article
TCAD simulation study of dual ferroelectric gate field-effect transistors with a recessed channel geometry for non-volatile memory applications
In this study, we propose a ferroelectric FET (FeFET) structure termed dual ferroelectric recessed channel FeFET (DF-RFeFET), employing metal–ferroelectric (FE)–metal–FE–metal–SiO2 interlayer (IL)–silicon (MFMFMI...