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Article
On-Chip Clock Faults' Detector
This paper proposes an on-chip detector for the on-line testing of faults affecting clock signals and making them change with incorrect duty-cycle. Our scheme is particularly suitable to be integrated within S...
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Article
Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults
This work presents a design technique for CMOS static and dynamic checkers (to be used in self-checking circuits), that allows the detection of all internal single transistor stuck-on and bridging faults causi...
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Article
Fault simulation for general FCMOS ICs
This work presents a technique to correctly deal with non-stuck-at faults in FCMOS circuits making use of complex macrogates. This method can be applied to any gate-level fault simulator providing, for each li...
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Chapter
Reliability of GaAs MESFETs
The paper presents new data on the reliability of GaAs MESFETs for microwave telecommunications obtained from the analysis of field repairs and accelerated tests. This work represents a systematic investigatio...