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    Article

    Microstructure Analysis of Silicon Nanowalls: Insights from Positron Beam Doppler Broadening Measurements

    Silicon nanowalls atop the (100) – oriented boron doped P-type (1–10 Ω-cm) single crystalline silicon wafers were prepared using a metal assisted chemical etching route for different durations 1, 5, 15, and 30...

    C. Lakshmanan, R. N. Viswanath, Anil K. Behera, P. K. Ajikumar, R. Rajaraman in Silicon (2024)

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    Article

    Electrochemical studies on wafer-scale synthesized silicon nanowalls for supercapacitor application

    Silicon-based supercapacitors are highly essential for the utilization of supercapacitor technology in consumer electronics, owing to their on-chip integration with the well-established complementary metal–oxi...

    Anil K Behera, C Lakshmanan, R N Viswanath, C Poddar in Bulletin of Materials Science (2020)