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  1. No Access

    Article

    Parameters and Composition of Plasma in a CF4 + H2 + Ar Mixture: Effect of CF4/H2 Ratio

    The electrophysical parameters of the plasma and the kinetics of plasma-chemical processes in a CF4 + H2 + Ar mixture while varying the CF4/H2 ratio are studied. When using diagnostic methods and plasma modeling ...

    A. V. Miakonkikh, V. O. Kuzmenko, A. M. Efremov, K. V. Rudenko in Russian Microelectronics (2024)

  2. No Access

    Article

    Excitation Pulse Selection for UWB Antenna

    The paper studies the influence of the voltage pulse waveform exciting the UWB antenna, on the radiated E-field amplitude. It is shown that the radiated pulse amplitude of the combined antenna excited by bipol...

    Yu. A. Andreev, A. M. Efremov, V. V. Plisko in Russian Physics Journal (2023)

  3. No Access

    Article

    Four-Channel Former of Bipolar Pulses of Various Durations in a Circuit with One Spark Gap

    A four-channel bipolar pulse former with an amplitude of up to 80 kV, a duration of 1 ns (2 channels) and 2 ns (2 channels) and a repetition rate of 100 Hz at 50 Ohm loads is developed. The former is designed ...

    A. M. Efremov, V. M. Alexeenko in Russian Physics Journal (2023)

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    Article

    The Influence of Small F2, H2, and HF Additives on the Concentration of Active Particles in Tetrafluoromethane Plasma

    A comparative study of the effect of small (up to 20%) substituting additives F2, H2, and HF on the kinetics and stationary concentrations of neutral particles in 50% CF4 + 50% Ar plasma under the typical conditi...

    A. M. Efremov, S. A. Smirnov, V. B. Betelin in Russian Microelectronics (2023)

  5. No Access

    Article

    Concentration of Fluorine Atoms and Kinetics of Reactive-Ion Etching of Silicon in CF4 + O2, CHF3 + O2, and C4F8 + O2 Mixtures

    A comparative study of the electrophysical parameters of the plasma, the fluorine atom concentrations, and the kinetics of reactive-ion etching of silicon in CF4 + O2, CHF3 + O2, and C4F8 + O2 mixtures of a varia...

    A. M. Efremov, A. V. Bobylev, K.-H. Kwon in Russian Microelectronics (2023)

  6. No Access

    Article

    A High-Power Source of Ultrawideband Radiation of Subnanosecond Duration with Controllable Characteristics

    A high-power source of ultrawideband radiation of subnanosecond duration based on a hybrid antenna with an offset reflector has been developed. At the focus of the reflector, there is an array of 2 × 2 combine...

    E. V. Balzovsky, Yu. I. Buyanov, A. M. Efremov in Instruments and Experimental Techniques (2023)

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    Article

    Plasma Parameters and Kinetics of Reactive Ion Etching of SiO2 and Si3N4 in an HBr/Cl2/Ar Mixture

    The parameters of the gas phase and the kinetics of reactive ion etching of SiO2 and Si3N4 under conditions of an induction RF (13.56 MHz) discharge with a varying HBr/Cl2 ratio is studied. The study includes pla...

    A. M. Efremov, V. B. Betelin, K.-H. Kwon in Russian Microelectronics (2023)

  8. No Access

    Article

    Controlling Silicon Etching Parameters in RF CHF3 Plasma by Optical Emission Spectroscopy

    The processes of plasma-chemical and reactive-ion etching of silicon in trifluoromethane (CHF3) are studied using optical emission spectroscopy. The dependences of the radiation intensities of atoms and molecules...

    D. B. Murin, I. A. Chesnokov, S. A. Pivovarenok, A. M. Efremov in Russian Microelectronics (2023)

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    Article

    Parameters of Gaseous Phase and Kinetics of Reactive Ion Etching of SiO2 in CF4/C4F8/Ar/He Plasma

    The electrophysical parameters of plasma, concentrations of fluorine atoms, and kinetics of reactive-ion heterogeneous processes in the CF4 + C4F8 + Ar + He mixture with the variation of the Ar/He ratio and bias ...

    A. M. Efremov, K.-H. Kwon in Russian Microelectronics (2022)

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    Article

    On the Effect of the Cl2 + O2 + Ar Mixture Composition on the Concentrations of Chlorine and Oxygen Atoms in a Plasma

    The effect of the initial composition of the Cl2 + O2 + Ar mixture on the electrical parameters of a plasma and stationary concentrations of atomic particles under an inductive rf (13.56 MHz) discharge is studied...

    I. I. Amirov, M. O. Izyumov, A. M. Efremov in Russian Microelectronics (2022)

  11. No Access

    Article

    Peculiarities of the Kinetics of Heterogeneous Processes during the Etching of Silicon in CF4 and C2Br2F4 Plasma

    A comparative study of the parameters of the plasma discharge and kinetics of heterogeneous processes (etching, polymerization) occurring on the silicon surface in CF4 and C2Br2F4 plasma is carried out. Plasma di...

    A. V. Miakonkikh, V. O. Kuzmenko, A. M. Efremov, K. V. Rudenko in Russian Microelectronics (2022)

  12. No Access

    Article

    On the Mechanisms Regulating the Plasma Composition and Kinetics of Heterogeneous Processes in a CF4 + CHF3 + Ar Mixture

    The influence of the initial composition of a CF4 + CHF3 + Ar mixture and bias power on the electrical parameters of the plasma, the composition of the gas phase, and the kinetics of heterogeneous processes on th...

    A. M. Efremov, V. B. Betelin, K.-H. Kwon in Russian Microelectronics (2022)

  13. No Access

    Article

    Plasma Parameters and Kinetics of Reactive-Ion Etching of Silicon in a C6F12O + Ar Mixture

    The characteristics of the gas phase and the kinetics of reactive-ion etching of silicon in a 50% C6F12O + 50% Ar plasma are studied. The study scheme includes plasma diagnostics using Langmuir probes and optical...

    A. M. Efremov, V. B. Betelin, K.-H. Kwon in Russian Microelectronics (2022)

  14. No Access

    Article

    Mechanisms of Plasma Etching of Titanium, Indium, Tin, and Zinc Oxides in a Mixture of HBr + Ar

    The kinetics and mechanisms of reactive ion etching of titanium oxides (TiO2), indium (In2O3), tin (SnO2), and zinc (ZnO) in HBr + Ar plasma. It is found that an increase in the fraction of Ar is accompanied by a...

    A. M. Efremov, S. A. Smirnov, V. B. Betelin, K.-H. Kwon in Russian Microelectronics (2021)

  15. No Access

    Article

    Specific Features of the Kinetics of the Reactive-Ion Etching of Si and SiO2 in a CF4 + O2 Mixture in a Low Power Supply Mode

    The kinetics of reactive ion etching of Si and SiO2 in the plasma of a high-frequency (13.56 MHz) inductive discharge in a CF4 + O2 mixture in the range of input power of 200–600 W (0.02–0.06 W/cm3) is studied. T...

    A. M. Efremov, V. B. Betelin, K.-H. Kwon in Russian Microelectronics (2021)

  16. No Access

    Article

    Kinetics of Reactive Ion Etching of Si, SiO2, and Si3N4 in C4F8 + O2 + Ar Plasma: Effect of the C4F8/O2 Mixing Ratio

    The kinetics of reactive ion etching of an Si, SiO2, and Si3N4 in the C4F8 + O2 + Ar mixture with a varied C4F8/O2 mixing ratio under the conditions of an rf inductive discharge (13.56 MHz) is investigated. Using...

    A. M. Efremov, K.-H. Kwon in Russian Microelectronics (2021)

  17. No Access

    Article

    Kinetics of the Volumetric and Heterogeneous Processes in the Plasma of a C4F8 + O2 + Ar Mixture

    In this paper, we investigate the relationship between the external and internal plasma parameters in a C4F8 + O2 + Ar mixture under conditions of an inductive radio-frequency (13.56 MHz) discharge. With the comb...

    A. M. Efremov, D. B. Murin, A. M. Sobolev, K.-H. Kwon in Russian Microelectronics (2021)

  18. No Access

    Article

    Kinetics and Mechanisms of Reactive-Ion Etching of Si and SiO2 in a Plasma of a Mixture of HBr + O2

    In this paper, we investigate the kinetics and mechanisms of reactive-ion etching of Si and SiO2 in the plasma of an HBr + O2 mixture with a variable initial composition under conditions of the high-frequency (13...

    A. M. Efremov, V. B. Betelin, K.-H. Kwon in Russian Microelectronics (2020)

  19. No Access

    Article

    Plasma Parameters and Kinetics of Active Particles in the Mixture CHF3 + O2 + Ar

    The effect of the O2/Ar component ratio in the CHF3 + O2 + Ar mixture on the electrical parameters of the plasma, kinetics of active particles, and their stationary concentrations under the high-frequency (13.56 ...

    A. M. Efremov, D. B. Murin, K.-H. Kwon in Russian Microelectronics (2020)

  20. No Access

    Article

    Concerning the Effect of Type of Fluorocarbon Gas on the Output Characteristics of the Reactive-Ion Etching Process

    The comparative research of the parameters, steady-state composition, and the effects of heterogeneous interaction in the plasma of fluorocarbon gases CxHyFz with various z/x relations in conditions of an inducti...

    A. M. Efremov, D. B. Murin, K.-H. Kwon in Russian Microelectronics (2020)

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