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    Chapter

    Test Generation: A Heuristic Approach

    The adoption of the System-on-Chip design paradigm creates new challenges for designers and test engineers. In this chapter a high-level test generation approach is presented, which is able to produce high-qua...

    O. Goloubeva, M. Sonza Reorda, M. Violante in System-level Test and Validation of Hardwa… (2005)