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  1. No Access

    Article

    On-Chip Clock Faults' Detector

    This paper proposes an on-chip detector for the on-line testing of faults affecting clock signals and making them change with incorrect duty-cycle. Our scheme is particularly suitable to be integrated within S...

    C. Metra, M. Favalli, S. Di Francescantonio, B. Riccò in Journal of Electronic Testing (2002)

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    Article

    Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults

    This work presents a design technique for CMOS static and dynamic checkers (to be used in self-checking circuits), that allows the detection of all internal single transistor stuck-on and bridging faults causi...

    C. Metra, M. Favalli, P. Olivo, B. Riccò in Journal of Electronic Testing (1995)

  3. No Access

    Article

    Fault simulation for general FCMOS ICs

    This work presents a technique to correctly deal with non-stuck-at faults in FCMOS circuits making use of complex macrogates. This method can be applied to any gate-level fault simulator providing, for each li...

    M. Favalli, P. Olivo, B. Riccò, F. Somenzi in Journal of Electronic Testing (1991)