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Article
On-Chip Clock Faults' Detector
This paper proposes an on-chip detector for the on-line testing of faults affecting clock signals and making them change with incorrect duty-cycle. Our scheme is particularly suitable to be integrated within S...
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Article
Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults
This work presents a design technique for CMOS static and dynamic checkers (to be used in self-checking circuits), that allows the detection of all internal single transistor stuck-on and bridging faults causi...
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Article
Fault simulation for general FCMOS ICs
This work presents a technique to correctly deal with non-stuck-at faults in FCMOS circuits making use of complex macrogates. This method can be applied to any gate-level fault simulator providing, for each li...
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Article
The origin of charge density waves in the 2H-polytypes of the group-V layer compounds
The group-V metallic layer compounds exhibit superconductivity at low temperatures and all (except NbS2) undergo phase changes due to the formation of CDW at certain temperatures. In order to understand this theo...