Skip to main content

Page of 3
and
  1. No Access

    Article

    Monte Carlo Modeling of VLWIR HgCdTe Interdigitated Pixel Response

    Increasing very long-wave infrared (VLWIR, λ c ≈ 15 μm) pixel operability was approached by subdividing each pixel into four interdigitated subpixels. High response is maintained across th...

    A. I. D’Souza, M. G. Stapelbroek, P. S. Wijewarnasuriya in Journal of Electronic Materials (2010)

  2. No Access

    Article

    Arsenic Diffusion Study in HgCdTe for Low p-Type Do** in Auger-Suppressed Photodiodes

    Controllable p-type do** at low concentrations is desired for multilayer HgCdTe samples in a P +/π/N + structure due to the promise of suppressing Auger processes...

    A. M. Itsuno, P. Y. Emelie, J. D. Phillips, S. Velicu in Journal of Electronic Materials (2010)

  3. No Access

    Article

    Dislocation Reduction of HgCdTe/Si Through Ex Situ Annealing

    Current growth methods of HgCdTe/Cd(Se)Te/Si by molecular-beam epitaxy (MBE) result in a dislocation density of mid 106 cm−2 to low 107 cm−2. Although the exact mechanism is unknown, it is well accepted that this...

    G. Brill, S. Farrell, Y. P. Chen, P. S. Wijewarnasuriya in Journal of Electronic Materials (2010)

  4. No Access

    Article

    Ex Situ Thermal Cycle Annealing of Molecular Beam Epitaxy Grown HgCdTe/Si Layers

    We present the results of ex situ thermal cycle annealing (TCA) of molecular beam epitaxy grown mercury cadmium telluride (HgCdTe) on Cd(Se)Te/Si(211) composite substrates. We examined the variation in the etch p...

    S. Farrell, G. Brill, Y. Chen, P. S. Wijewarnasuriya in Journal of Electronic Materials (2010)

  5. No Access

    Article

    Topography and Dislocations in (112)B HgCdTe/CdTe/Si

    Scanning electron microscopy (SEM), atomic force microscopy (AFM), and x-ray diffraction (XRD) measurements all indicate an approximate factor of ten increase in the Everson etch pit density (EPD) over standar...

    J. D. Benson, P. J. Smith, R. N. Jacobs, J. K. Markunas in Journal of Electronic Materials (2009)

  6. No Access

    Article

    Modeling of LWIR HgCdTe Auger-Suppressed Infrared Photodiodes under Nonequilibrium Operation

    The general approach and effects of nonequilibrium operation of Auger-suppressed HgCdTe infrared photodiodes are well understood. However, the complex relationships of carrier generation and dependencies on no...

    P.Y. Emelie, S. Velicu, C.H. Grein, J.D. Phillips in Journal of Electronic Materials (2008)

  7. No Access

    Article

    Surface Morphology and Defect Formation Mechanisms for HgCdTe (211)B Grown by Molecular Beam Epitaxy

    The surface morphology and crystallinity of HgCdTe films grown by molecular beam epitaxy (MBE) on both CdZnTe and CdTe/Si (211)B substrates were characterized using atomic force microscopy (AFM), as well as sc...

    Yong Chang, C.R. Becker, C.H. Grein, J. Zhao, C. Fulk in Journal of Electronic Materials (2008)

  8. No Access

    Article

    Passivation effect on optical and electrical properties of molecular beam epitaxy-grown HgCdTe/CdTe/Si layers

    The effects of passivation with two different passivants, ZnS and CdTe, and two different passivation techniques, physical vapor deposition (PVD) and molecular beam epitaxy (MBE), were quantified in terms of t...

    Rajni Kiran, Shubhrangshu Mallick, Suk-Ryong Hahn in Journal of Electronic Materials (2006)

  9. No Access

    Article

    Correlation between visual defects and increased dark current in large-area Hg1−xCdxTe photodiodes

    The Cross-Track Infrared Sounder (CrIS) program [an instrument on the National Polar-Orbiting Operational Environmental Satellite System (NPOESS)] requires photodiodes with spectral cutoffs denoted by short-wa...

    A. I. D’Souza, M. G. Stapelbroek, R. Willis in Journal of Electronic Materials (2005)

  10. No Access

    Article

    Correlation of CdZnTe(211)B substrate surface morphology and HgCdTe(211)B epilayer defects

    We present results on the surface morphology and recombination lifetimes of molecular-beam epitaxy (MBE)-grown HgCdTe (211)B epilayers and correlate them with the roughness of the CdZnTe substrate surfaces. Th...

    J. Zhao, Y. Chang, G. Badano, S. Sivananthan in Journal of Electronic Materials (2004)

  11. No Access

    Article

    1/f noise in large-area Hg1−xCdxTe photodiodes

    The 1/f noise in photovoltaic (PV) molecular-beam epitaxy (MBE)-grown Hg1−xCdxTe double-layer planar heterostructure (DLPH) large-area detectors is a critical noise component with the potential to limit sensitivi...

    A. I. D’Souza, M. G. Stapelbroek, P. N. Dolan in Journal of Electronic Materials (2003)

  12. No Access

    Article

    1/f noise in very-long-wavelength infrared Hg1−xCdx Te detectors

    This paper investigates 1/f noise performance of very-long-wavelength infrared (VLWIR) Hg1−xCdxTe (cutoff wavelengths λc=15 µm and λc=16 µm) photodiodes at 78 K, where detector current is varied by changing detec...

    A. I. D’Souza, M. G. Stapelbroek, P. S. Wijewarnasuriya in Journal of Electronic Materials (2002)

  13. No Access

    Article

    Advances in large-area Hg1−xCdxTe photovoltaic detectors for remote-sensing applications

    State-of-the-art large-area photovoltaic (PV) detectors fabricated in HgCdTe grown by molecular beam epitaxy (MBE) have been demonstrated for the Crosstrack Infrared Sounder (CrIS) instrument. Large-area devic...

    P. S. Wijewarnasuriya, M. Zandian, J. Phillips in Journal of Electronic Materials (2002)

  14. No Access

    Article

    Current mechanisms in VLWIR Hg1−xCdxTe photodiodes

    VLWIR (c∼15 m to 17 m at 78 K) detectors have been characterized as a function of temperature to determine the dominant current mechanisms impacting detector performance. Id−Vd curves indicate that VLWIR detector...

    A. I. D'Souza, R. E. Dewames, P. S. Wijewarnasuriya in Journal of Electronic Materials (2001)

  15. No Access

    Article

    Large VLWIR Hg1−xCdxTe photovoltaic detectors

    Very long wavelength infrared (VLWIR; 15 to 17 µm) detectors are required for remote sensing sounding applications. Infrared sounders provide temperature, pressure and moisture profiles of the atmosphere used ...

    A. I. D’Souza, L. C. Dawson, C. Staller in Journal of Electronic Materials (2000)

  16. No Access

    Article

    Excess low frequency noise/I-V studies in p-on-n MBE LWIR Hg1−xCdxTe detectors

    Excess low frequency noise is investigated for the first time in infrared MBE grown LWIR Hg1−xCdxTe double layer planar heterostructure (DLPH) detectors grown on lattice matched substrates. LWIR detectors having ...

    A. I. D’Souza, P. S. Wijewarnasuriya, R. E. Dewames in Journal of Electronic Materials (1999)

  17. No Access

    Article

    Arsenic incorporation in MBE grown Hg1−xCdxTe

    The p-type do** of Hg1−xCdxTe (MCT) has proven to be a significant challenge in present day MCT-based detector technology. One of the most promising acceptor candidates, arsenic, behaves as an amphoteric dopant...

    C. H. Grein, J. W. Garland, S. Sivananthan in Journal of Electronic Materials (1999)

  18. No Access

    Article

    Microscopic defects on MBE grown LWIR Hg1−xCdxTe material and their impact on device performance

    Long wavelength infrared molecular beam epitaxy (MBE) grown p-on-n Hg1−xCdxTe double layer planar heterostructure (DLPH) detectors have been characterized to determine the dominant mechanisms limiting their perfo...

    P. S. Wijewarnasuriya, M. Zandian, D. B. Young in Journal of Electronic Materials (1999)

  19. No Access

    Article

    MBE growth and characterization of in situ arsenic doped HgCdTe

    We report the results of in situ arsenic do** by molecular beam epitaxy using an elemental arsenic source. Single Hg1−xCdxTe layers of x ∼0.3 were grown at a lower growth temperature of 175°C to increase the ar...

    A. C. Chen, M. Zandian, D. D. Edwall, R. E. De Wames in Journal of Electronic Materials (1998)

  20. No Access

    Article

    Analysis of the variation in the composition as a function of growth parameters in the MBE growth of indium doped Hg1−xCdxTe

    Compositional changes induced in growing Hg1−xCdxTe layers as a function of the changes in temperature of the indium source in the MBE chamber have been analyzed in terms of the Hg-In alloy thermodynamics and cha...

    H. R. Vydyanath, F. Aqariden, P. S. Wijewarnasuriya in Journal of Electronic Materials (1998)

Page of 3