Abstract
Low-temperature sintering piezoelectric ceramics of 0.3Pb(Zn1/3Nb2/3)O3–0.7Pb(Zr0.49Ti0.51)O3 with LiF and Sm2O3 additives were fabricated by a conventional solid-state reaction. In view of the possible defects caused by LiF do**, the as-sintered specimens were annealed in oxygen to enhance grain size and piezoelectric properties. X-ray diffraction revealed that Sm2O3 and LiF were dissolved in the lattices, forming a pure perovskite structure. Scanning electron microscopy showed that the grain size decreased with increased LiF amount. Hysteresis-loop studies indicated that increased LiF led to ferroelectricity deterioration. Impedance spectroscopy and activation-energy analyses revealed decreased oxygen vacancies after annealing in oxygen. Energy-dispersive spectrometry revealed that fluorine volatilized during annealing in oxygen. Thus, the decreased amounts of FO and VO were presumed responsible for the improved piezoelectric properties. Upon do** 1 mol% LiF, sintering temperature decreased from 1125 to 950 °C. Annealing in oxygen greatly improved the piezoelectric properties from d33 = 252 pC/N and Kp = 0.53 to d33 = 403 pC/N and Kp = 0.56, respectively.
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Acknowledgements
This work was supported by International Scientific and Technological Innovation Cooperation Key Projects for National Key R&D Program of China (No.2016YFE0203900), the national Nature Science Foundation of China through Grant (Nos.61201051), and the Fundamental Research Funds for the Central Universities of China (HUST: 2016JCTD114).
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Zeng, Z., Wu, Q., Hao, M. et al. Impedance spectroscopy and piezoelectric property of LiF-doped PZN–PZT low-temperature sintering piezoelectric ceramics. J Mater Sci: Mater Electron 29, 8279–8286 (2018). https://doi.org/10.1007/s10854-018-8836-3
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DOI: https://doi.org/10.1007/s10854-018-8836-3