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Fabrication and Characterization of Rare Earth Scandate Thin Films Prepared by Pulsed Laser Deposition
The continuous structure size reduction in semiconductor technology is leading to a considerable attention for advanced high-κ dielectrics. The rare...
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Nondestructive Vis-NIR Reflectance Spectroscopy as a Forensic Tool for Ink Discrimination: A Preliminary Study
Visible light reflectance spectra were taken from signatures inscribed with five different inks of five different ball-point pens by a modular...
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Application of Electron Energy-Loss Spectroscopy for Analysis of the Microstructure of Reactor Materials
AbstractIt is shown by the example of hydrogen (in hydrides ZrH), helium (in pores after implantation), and nickel (in G -phase precipitates) that...
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Material Analysis and Testing
Material analysis and testing add information and systematics to development processes. This boosts the technological development speed and aids in...
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Helium Ion Microscopy
Microscopy is a widely used and resilient field which is essential for the analysis of typography, structure and composition right down to the atomic...
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Channeling and Backscatter Imaging
While the default imaging mode in HIM uses secondary electrons, backscattered helium or neon contains valuable information about the sample...
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Scanning Electron Microscopy
The scanning electron microscope (SEM) is the most widely used tool for characterizing and analyzing the surface of solid samples. It is utilized in...
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Defect Accumulation, Amorphization and Nanostructure Modification of Ceramics
A long-standing objective in materials research is to understandNanostructured and control the dynamic response of ceramic structures to...
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Blistering and cracking of LiTaO3 single crystal under helium ion implantation
Blistering and cracking in LiTaO 3 surface are investigated after 200-keV helium ion implantation and subsequent post-implantation annealing....
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Dielectric and insulating properties of SrTiO3/Si heterostructure controlled by cation concentration
SrTiO 3 films with different cation concentration were deposited on Si(001) substrates by oxide molecular beam epitaxy. An amorphous layer was...
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Adhesive strength, superhardness, and the phase and elemental compositions of nanostructured coatings based on Ti-Hf-Si-N
New superhard coatings based on Ti-Hf-Si-N with good physical and mechanical properties have been fabricated. A comparative analysis of the physical,...
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Sputtering of the target surface by Cs+ ions: Steady-state concentration of implanted cesium and emission of CsM+ cluster ions
Experimental data for the variation of the work function on the Si and GaAs semiconductor surfaces irradiated by cesium ions are presented. The...
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Surface Analysis Techniques Related to AES and XPS
Any analysis technique will provide a given characteristic property of a surface, such as atomic composition, chemical states, structural...
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Complementary and Emerging Techniques for Astrophysical Ices Processed in the Laboratory
Inter- and circumstellar ices comprise different molecules accreted on cold dust particles. These icy dust grains provide a molecule reservoir where...
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On-Orbit Degradation of Solar Instruments
We present the lessons learned about the degradation observed in several space solar missions, based on contributions at the Workshop about On-Orbit...
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Catalogue of Minor Planet Names and Discovery Circumstances Addendum 2012–2014
Title page of Giuseppe Piazzi’s book “On the discovery of the new planet CERES FERDINANDEA, the eighth of those known in our solar system”. The...
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Ion Beam Analysis and Normal-State Conduction Mechanisms for (Bi, Pb)-2223 and (Tl, Pb)/Sr-1212 Superconducting Phases Substituted by Ruthenium
Superconducting samples of type Bi 1.8 Pb 0.4 Sr 2 Ca 2.1 Cu 3− x Ru x O 10+ δ , (Bi, Pb)-2223, with 0.0≤ x ≤0.4 and type Tl 0.5 Pb 0.5 Sr 1.6 Ba 0.4 CaCu 2− x ...