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Shear performance of Cu/Sn–3.0Ag–0.5Cu/Cu joints with same solder volume and different heights at increasing current density
In this study, the shear performance and fracture behavior of microscale ball grid array (BGA) structure Cu/Sn–3.0Ag–0.5Cu/Cu joints with same solder...
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Influence of 0.05 wt% Pr addition on interfacial microstructure and mechanical properties of Sn–0.3Ag–0.7Cu/Cu solder joint during thermal shocking
In this study, the influence of 0.05 wt% rare earth (RE) Pr element addition on the thermal shocking reliability of low-silver Sn–0.3Ag–0.7Cu...
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Interfacial reaction and properties of Sn/Cu solder reinforced with graphene nanosheets during solid–liquid diffusion and reflowing
In this paper, different mass fractions (0, 0.01, 0.03, 0.05, 0.07, and 0.09 wt.%) of graphene nanosheets (GNSs) were selected as a strengthening...
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Monte Carlo-Based Stochastic Finite Element Model for Electromigration in the Interfaces of SAC Solder and Cu Conductors with Uncertainties in Boundary Conditions
The time-dependent progress of electromigration (EM) in the interfaces of Sn-Ag-Cu solder and Cu conductors is sensitive to the uncertainties in...
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Substrate Stimulated Orientation for Pure Aluminum
Oriented materials are of great importance, but their formation is rarely described. Here, nine Al/Al 2 O 3 systems were designed to identify the...
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Effects of W contents on the solid-state interfacial reactions of Sn/Co-W
Co-based alloys have received extensive attention as barrier layers of Sn/Cu joints in the microelectronic packaging. However, little attention has...
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Influence of Microstructure Evolution on the Current Density and Temperature Gradient of Line-Type Cu/Sn58Bi/Cu Microscale Solder Joints Under Current Stressing
Sn58Bi is a promising lead-free solder alloy for low-temperature soldering of electronic packaging. Because of the uneven distribution of the tin...
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Coupling effect of thermomigration and cross-interaction on evolution of intermetallic compounds in Cu/Sn/Ni ultrafine interconnects undergoing TLP bonding
By reflowing Cu/Sn/Ni ultrafine interconnects under a temperature gradient, a new transient liquid phase (TLP) bonding process was proposed for...
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Solid–liquid Interdiffusion Bonding of Cu/Sn/Ni Micro-joints with the Assistance of Temperature Gradient
A novel solid–liquid interdiffusion (SLID) bonding method with the assistance of temperature gradient (TG) was carried out to bonding Cu and Ni...
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Electromigration Behavior of Cu Core Solder Joints Under High Current Density
AbstractCu core solder ball (CCSB) is formed by a Cu core surrounded by solder alloy and is used as an interconnection material for 3D packaging....
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One-bath one-step dyeing of polyester/cotton (PC) blends fabric with disperse dyes after acetylation of cotton
Aiming at the classic problem of dyeing of polyester–cotton blended fabric one-bath one-step dyeing of PC blends with disperse dye after surface...
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Abnormal Intermetallic Compound Evolution in Ni/Sn/Ni and Ni/Sn-9Zn/Ni Micro Solder Joints Under Thermomigration
Interfacial reactions in Ni/Sn/Ni and Ni/Sn-9Zn/Ni micro solder joints during thermomigration (TM) have been studied by reflowing solder joints on a...
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RETRACTED ARTICLE: Nanofluids: properties and applications
AbstractNanofluids are liquid suspensions of hard nanometer-sized particles suspended in a base fluid. The suspension of small...
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Interfacial Behaviors in Cu/Molten Sn–58Bi/Cu Solder Joints Under Coupling with Thermal and Current Stressing
AbstractThe interfacial behaviors of Cu/molten Sn–58Bi/Cu solder joints under the coupling effect of a temperature gradient and the current stressing...
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Thermo-electro-mechanical modeling, simulation and experiments of field-assisted sintering
Contact growth and temperature behavior in time during a single high-current pulse representing the initial stage of field-assisted/spark plasma...
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Microstructure and properties of Sn-Ag and Sn-Sb lead-free solders in electronics packaging: a review
Electronic devices need to work at high temperature in some fields for a long time, peculiarly step soldering technology, primary packaging and...
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Impact of Mechanical Property Degradation and Intermetallic Compound Formation on Electromigration-Oriented Failure of a Flip-Chip Solder Joint
Due to the increased complexity and optimization in microprocessor packaging from 2D to 3D packages, the size of solder joints is being reduced...
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Formation of Intermetallic Compounds and Microstructure Evolution due to Isothermal Reactive Diffusion at the Interface Between Solid Co and Liquid Sn
Co has been studied extensively by many research groups as an alternative material for underbump metallization, since Co–Sn compounds show better...