We are improving our search experience. To check which content you have full access to, or for advanced search, go back to the old search.

Search

Please fill in this field.
Filters applied:

Search Results

Showing 1-20 of 10,000 results
  1. Machine Allocation in Semiconductor Wafer Fabrication Systems: A Simulation-Based Approach

    The problem of maximizing the throughput of Semiconductor Wafer Fabrication Systems is addressed. We model the fabrication systems as a Stochastic...

    Article 08 March 2023
  2. Silicon Wafer Processing

    This chapter reviews the Si wafer-processing technology, including ingot heat treatment, cutting, slicing, lap**, polishing, wafer cleaning, and...
    Deren Yang, **ngbo Liang, Xuegong Yu in Handbook of Integrated Circuit Industry
    Reference work entry 2024
  3. A Novel Approach to Model and Analyze Wafer–Wafer Hybrid Bonding

    In wafer–wafer hybrid bonding, maintaining vigorous reliability of bonding and minimal deformation is essential. This paper probes the methodology...
    Debika Chaudhuri, Hafizur Rahaman, Tamal Ghosh in Emerging Electronic Devices, Circuits and Systems
    Conference paper 2023
  4. 200-mm-wafer-scale integration of polycrystalline molybdenum disulfide transistors

    Two-dimensional semiconductors are an attractive material for making thin-film transistors due to their scalability, transferability, atomic...

    Junyoung Kwon, Minsu Seol, ... Kyung-Eun Byun in Nature Electronics
    Article 24 April 2024
  5. A Hybrid Multi-objective Genetic Algorithm Combined with Dispatching Rule for Wafer Test Scheduling

    Wafer test, also known as wafer probe or wafer sort, is a critical process that ensures the quality of dies after the wafer has been fabricated....
    Chun-An Chen, Hung-Kai Wang, Chia-Le Wu in Proceedings of Industrial Engineering and Management
    Conference paper 2024
  6. A vacuum-deposited polymer dielectric for wafer-scale stretchable electronics

    Despite recent advances in materials and fabrication technologies, the development of intrinsically stretchable electronic devices with large-area...

    Ja Hoon Koo, Juyeon Kang, ... Donghee Son in Nature Electronics
    Article 02 February 2023
  7. Wafer particle inspection technique using computer vision based on a color space transform model

    The preparation of defect-free wafers serves as a critical stage prior to fabrication of devices or chips as it is not possible to pattern any...

    Heebum Chun, **gyan Wang, ... ChaBum Lee in The International Journal of Advanced Manufacturing Technology
    Article 05 July 2023
  8. Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions

    In complex manufacturing systems, such as a semiconductor wafer fabrication facility (wafer fab), it is important to accurately predict cycle times...

    Patrick C. Deenen, Jeroen Middelhuis, ... Ivo J. B. F. Adan in Flexible Services and Manufacturing Journal
    Article Open access 16 June 2023
  9. Fabrication of MEMS Cantilever: A Case Study

    MEMS technology can be incorporated into a wide variety of electronic components. Sensors are the dominant application of MEMS techniques; there are...
    Conference paper 2024
  10. Emerging MoS2 Wafer-Scale Technique for Integrated Circuits

    As an outstanding representative of layered materials, molybdenum disulfide (MoS 2 ) has excellent physical properties, such as high carrier mobility,...

    Zimeng Ye, Chao Tan, ... Mingdong Dong in Nano-Micro Letters
    Article Open access 18 January 2023
  11. Highly-sensitive wafer-scale transfer-free graphene MEMS condenser microphones

    Since the performance of micro-electro-mechanical system (MEMS)-based microphones is approaching fundamental physical, design, and material limits,...

    Roberto Pezone, Sebastian Anzinger, ... Sten Vollebregt in Microsystems & Nanoengineering
    Article Open access 21 February 2024
  12. Application of Deep Learning for Wafer Defect Classification in Semiconductor Manufacturing

    Wafer map defect pattern classification is an important task for yield enhancement in semiconductor manufacturing. In this study, we proposed a...
    Conference paper 2023
  13. A new fabrication method for enhancing the yield of linear micromirror arrays assisted by temporary anchors

    As one of the most common spatial light modulators, linear micromirror arrays (MMAs) based on microelectromechanical system (MEMS) processes are...

    **ngchen **ao, Ting Mao, ... Yiting Yu in Microsystems & Nanoengineering
    Article Open access 20 May 2024
  14. Femtosecond laser-assisted fabrication of piezoelectrically actuated crystalline quartz-based MEMS resonators

    A novel technology for the precise fabrication of quartz resonators for MEMS applications is introduced. This approach is based on the laser-induced...

    John Linden, Neta Melech, ... Marina Sirota in Microsystems & Nanoengineering
    Article Open access 30 March 2023
  15. Wafer-level vapor cells filled with laser-actuated hermetic seals for integrated atomic devices

    Atomic devices such as atomic clocks and optically-pumped magnetometers rely on the interrogation of atoms contained in a cell whose inner content...

    Vincent Maurice, Clément Carlé, ... Nicolas Passilly in Microsystems & Nanoengineering
    Article Open access 14 December 2022
  16. Production Scheduling of Semiconductor Wafer Fabrication Facilities Using Real-Time Combinatorial Dispatching Rule

    Fabrication of semiconductor wafers is a complicated and challenging process with huge system complexity and stochasticity in operations. To improve...
    Suraj Panigrahi, Srijeta Agrahari, ... V. K. Manupati in International Conference on Reliable Systems Engineering (ICoRSE) - 2021
    Conference paper 2022
  17. Machine Learning Support for Wafer-Level Failure Pattern Analytics

    This chapter comprises four sections and is dedicated to wafer-level failure pattern analytics. Each section is based on a particular perspective...
    Chapter 2023
  18. Evolution of Wafer Bonding Technology and Applications from Wafer-Level Packaging to Micro/Nanofluidics-Enhanced Sensing

    In this chapter, we outline the revolution of wafer bonding technologies in microelectromechanical systems (MEMS) packaging and their applications in...
    Jikai Xu, Zhihao Ren, ... Chengkuo Lee in Advanced MEMS/NEMS Fabrication and Sensors
    Chapter 2022
  19. Development of Highly Sensitive and Stable SAW-based Temperature Sensor Array and its Interface Electronics for Realtime Monitoring of Wafer Surface Temperature in Plasma Chamber

    Temperature sensor array and its associated peripheral interface electronics has been developed for real-time monitoring of the wafer surface...

    Hyunho Lee, Sihyeok Kim, ... Keekeun Lee in Journal of Electrical Engineering & Technology
    Article 16 December 2023
  20. Wafer-scale probing of spin qubits

    Katharina Zeissler in Nature Electronics
    Article 24 May 2024
Did you find what you were looking for? Share feedback.