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    Article

    Crystallization-dependent structural and optical properties of Mn1.56Co0.96Ni0.48O4 thin films grown by chemical solution deposition on Si (100)

    Mn1.56Co0.96Ni0.48O4 (MCN) thin films are deposited onto Si (100) substrate under different post-annealing temperatures of 450 °C and 600 °C. As identified by the X-ray diffraction (XRD) and SEM, pronounced diffe...

    W. Zhou, C. Y. Wu, Y. M. Yin, W. L. Ma, Z. M. Huang in Applied Physics A (2019)

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    Article

    Infrared optical properties of Mn1.56Co0.96Ni0.48O4 thin films prepared by chemical solution deposition

    ∼2 μm thick Mn1.56Co0.96Ni0.48O4 (MCN) films have been prepared on a Al2O3 substrate by the chemical solution deposition method. X-ray diffraction and microstructure analyses show good crystallization and the thi...

    Y. Q. Gao, Z. M. Huang, Y. Hou, J. Wu, W. Zhou, L. B. Zhang, J. H. Chu in Applied Physics A (2014)

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    Article

    Effects of substrate temperature on the dielectric function of ZnO films

    ZnO films were deposited by RF magnetron sputtering at the substrate temperature of 120∼420°C. XRD measurements revealed the improvement of crystalline quality and grain size of the films with substrate temper...

    Y. Q. Gao, J. H. Ma, Z. M. Huang, Y. Hou, J. Wu, J. H. Chu in Applied Physics A (2009)

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    Article

    Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition

    BiFeO3 thin films have been grown on Pt(111)/Ti/SiO2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical pro...

    Y.W. Li, J.Q. Xue, J.L. Sun, X.J. Meng, Z.M. Huang, J.H. Chu in Applied Physics A (2007)

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    Article

    Spectroscopic ellipsometry investigations of PLT ferroelectric thin films with various La concentrations in the mid-infrared spectral region

    (Pb1-xLax)Ti1-x/4O3 (PLT) ferroelectric thin films with various La concentrations have been grown on LaNiO3/Si(100) substrates by a modified sol-gel technique. X-ray-diffraction analyses show that the PLT and L...

    Z.G. Hu, F.W. Shi, Z.M. Huang, Y.N. Wu, G.S. Wang, J.H. Chu in Applied Physics A (2005)

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    Article

    Infrared optical properties of PbZr0.4Ti0.6O3/La0.5Sr0.5CoO3 heterostructures on platinized silicon substrate

    PbZr0.4Ti0.6O3/La0.5Sr0.5CoO3 heterostructures have been grown on Pt/Ti/SiO2/Si substrates by chemical solution routes. Optical properties of the PbZr0.4Ti0.6O3/La0.5Sr0.5CoO3 heterostructures were studied by inf...

    G.S. Wang, Z.G. Hu, Z.M. Huang, J. Yu, F.W. Shi, T. Lin, J.H. Ma in Applied Physics A (2004)