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Article
Crystallization-dependent structural and optical properties of Mn1.56Co0.96Ni0.48O4 thin films grown by chemical solution deposition on Si (100)
Mn1.56Co0.96Ni0.48O4 (MCN) thin films are deposited onto Si (100) substrate under different post-annealing temperatures of 450 °C and 600 °C. As identified by the X-ray diffraction (XRD) and SEM, pronounced diffe...
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Article
Infrared optical properties of Mn1.56Co0.96Ni0.48O4 thin films prepared by chemical solution deposition
∼2 μm thick Mn1.56Co0.96Ni0.48O4 (MCN) films have been prepared on a Al2O3 substrate by the chemical solution deposition method. X-ray diffraction and microstructure analyses show good crystallization and the thi...
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Article
Effects of substrate temperature on the dielectric function of ZnO films
ZnO films were deposited by RF magnetron sputtering at the substrate temperature of 120∼420°C. XRD measurements revealed the improvement of crystalline quality and grain size of the films with substrate temper...
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Article
Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition
BiFeO3 thin films have been grown on Pt(111)/Ti/SiO2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical pro...
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Article
Spectroscopic ellipsometry investigations of PLT ferroelectric thin films with various La concentrations in the mid-infrared spectral region
(Pb1-xLax)Ti1-x/4O3 (PLT) ferroelectric thin films with various La concentrations have been grown on LaNiO3/Si(100) substrates by a modified sol-gel technique. X-ray-diffraction analyses show that the PLT and L...
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Article
Infrared optical properties of PbZr0.4Ti0.6O3/La0.5Sr0.5CoO3 heterostructures on platinized silicon substrate
PbZr0.4Ti0.6O3/La0.5Sr0.5CoO3 heterostructures have been grown on Pt/Ti/SiO2/Si substrates by chemical solution routes. Optical properties of the PbZr0.4Ti0.6O3/La0.5Sr0.5CoO3 heterostructures were studied by inf...