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  1. No Access

    Chapter and Conference Paper

    Exploring structural dependence of magnetic properties in FePt nanoparticle by Cs-corrected HRTEM

    Well-separated and size-controlled FePt nanoparticles are promising for magnetic data storages with ultra-high areal densities [1]. Chemically ordered L1o-FePt shows high magneto-crystalline anisotropy and an ...

    Z. L. Zhang, J. Biskupek, U. Kaiser in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Quantification and Segmentation of Electron Tomography Data- Exemplified at ErSi2 Nanocrystals in SiC

    Small transition metal crystals embedded in a semiconducting matrix are nanostructured systems with potential applications in nanotechnology. As their size distribution plays a key role for the detailed unders...

    J. Leschner, J. Biskupek, A. Chuvilin in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Application of 80kV Cs-corrected TEM for nanocarbon materials

    Being one of the main methods for studying the atomic structure of carbon materials, high resolution TEM suffers from a serious flaw as the energy of electrons, necessary to obtain atomic resolution (200–300 k...

    A. Chuvilin, U. Kaiser, D. Obergfell in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Low Loss Electron Energy Spectroscopy on LiFePO4 for Li ion Battery Applications

    LiFePO4 is a potential cathode material for high energy Li ion battery applications. The potential of this material in Li ion battery applications is hindered by its low electronic and ionic conductivity [1]. Dop...

    M. Kinyanjui, U. Kaiser in EMC 2008 14th European Microscopy Congress… (2008)

  5. No Access

    Chapter and Conference Paper

    Complementary EM study on highly active nanodendritic Raney-type Ni catalysts with hierarchical build-up

    Nanostructured Raney-type Ni catalysts have been used in industry since the 1920s for the production of a wide range of chemicals. [1] In the EU supported project IMPRESS it has been shown that by using gas at...

    U. Hörmann, U. Kaiser, N. Adkins in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    HREM characterization of BST-MgO interface

    It is known the properties of thin ferroelectric films can be different from bulk materials, that is concerned with an influence of mechanical stress (up to several GPa) at the film — substrate interface [1]. ...

    O. M. Zhigalina, A. N. Kuskova in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Domain structure in Delithiated LiFePO4, a cathode material for Li ion Battery Applications

    Delithiation is a basic step in the operation of the Li ion battery and it involves the extraction of Li ions from the lattice of the cathode material and insertion into the lattice of the anode. LiFePO4 is a cat...

    M. Kinyanjui, A. Chuvilin, U. Kaiser in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Quantitative Investigations of the Depth of Field in a Corrected High Resolution Transmission Electron Microscope

    Aberration correction in modern TEMs moves the interpretable resolution level to the ultimate information limit of the microscope in the sub-Ångström region. It was expected for HRTEM lattice imaging that the ...

    J. Biskupek, A. Chuvilin, J. R. **schek in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Structural properties of sol-gel synthesized Li+-doped titania nanowhisker arrays

    Nanostructured titania is of particular interest for applications in photo-catalysis due to its high catalytic activity. Moreover, these structures are of particular interest for many applications due to their...

    U. Hörmann, J. Geserick, S. Selve, U. Kaiser in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects?

    In recent years, the scientific discoveries and technological developments of greatest economic impact have largely been those situated at the interface between the classical disciplines of physics, chemistry,...

    U. Kaiser, A. Chuvilin, R. R. Schröder in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Determination of interface structure of YBCO/LCMO by a spherical aberration- corrected HRTEM

    Heterostructure interface plays an important role in modern microelectronics, which could be effectively used to control various electronic and magnetic properties by tuning the atomic structure and chemical c...

    Z. L. Zhang, U. Kaiser, S. Soltan in EMC 2008 14th European Microscopy Congress… (2008)

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    Article

    Vortex Dynamics in Bi2Sr2CaCu2O8 Single Crystal with Low Density Columnar Defects Studied by Magnetic Force Microscope

    We have studied vortex dynamics in Bi2Sr2CaCu2O8 single crystal with low density columnar defects by using a magnetic force microscope. Single crystal Bi2Sr2CaCu2O8 sample was irradiated by 1.3 GeV uranium ion to...

    U. H. Pi, D. H. Kim, Z. G. Khim, U. Kaiser in Journal of Low Temperature Physics (2003)

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    Article

    Partial dislocations and stacking faults in cubic SiC

    Numerous stacking faults and dislocations (formed by intersection of stacking faults and dislocations limiting nonintersecting stacking faults) in the 3C-SiC films grown by molecular beam epitaxy on a silicon sub...

    U. Kaiser, I. I. Khodos, M. N. Kovalchuk, W. Richter in Crystallography Reports (2001)

  14. No Access

    Article

    Molecular-beam epitaxy of a strongly lattice-mismatched heterosystem AlN/Si(111) for application in SAW devices

    The results of using molecular-beam epitaxy for growing piezoelectric AlN films on Si (111) substrates suitable for device applications are reported. The technological conditions for growth of stoichiometric A...

    D. G. Kipshidze, H. P. Schenk, A. Fissel, U. Kaiser, J. Schulze in Semiconductors (1999)