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X-Ray standing wave analysis of bismuth implanted in Si(110)

Perfect crystal silicon samples implanted with 60 KeV Bi atoms along the [110] surface normal direction were analyzed with X-ray standing waves. Two reflection orders, (220) and (440) were used with synchrontr...

N. Hertel, G. Materlik, J. Zegenhagen in Zeitschrift für Physik B Condensed Matter (1985)