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    Structural investigations of pulsed laser-deposited NiO epitaxial layers under different fluence values

    The epitaxial NiO layers deposited with higher fluence values are found to be strained, and the strain increases with the fluence values. The X-ray diffraction (XRD) profile taken from the synchrotron beam sho...

    S. D. Singh, Nirmalendu Patra, M. N. Singh, C. Mukherjee… in Journal of Materials Science (2019)